Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-16T10:31:41.771Z Has data issue: false hasContentIssue false

Electroluminescence and Spectral Shift of CdS Nanoparticles on Si Wafer

Published online by Cambridge University Press:  21 March 2011

Eih-Zhe Liang
Affiliation:
Graduate Institute of Electro-Optical Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
Ching-Fuh Lin
Affiliation:
Graduate Institute of Electro-Optical Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
Sheng-Ming Shih
Affiliation:
Institute of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
Wei-Fang Su
Affiliation:
Institute of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
Get access

Abstract

Preparation of CdS nanoparticles, devices fabrication, and electroluminescence properties at room temperature of CdS nanoparticles on silicon substrates are reported. A spectral shift of 86-meV of free exciton transition was observed that was due to the passivation of p-hydroxyl thiophenol molecules around nanoparticles. Controlled process conditions such as heat treatment and/or with oxygen-rich environment are experimented and found to have significant influences on emission spectra. Radiative recombination corresponding to oxygen-impurity level, 273 meV below bandgap energy, presents in samples prepared in oxygen-rich environment. In addition to such mechanism, coalescence of nanoparticles into bulk form also exists and contributes to enhanced luminescence.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Butty, J., Hu, Y.Z., Peyghambarian, N., Kao, Y.H., and Mackenzie, J.D., Appl. Phys. Lett. 67, 2672 (1995).Google Scholar
[2] Klimov, V.I., Milkhailovsky, A.A., Xu, Su, Malko, A., Hollingsworth, J.A., Leatherdale, C.A., Eisler, H.-J., and Bawendi, M.G., Science 290, 314 (2000).Google Scholar
[3] Veinot, J. G. C., Ginzburg, M., and Pietro, W. J., Chem. Mater. 9, 2117 (1997)Google Scholar
[4] Nanda, K.K., Sarangi, S.N., Sahu, S.N., Deb, S.K. and Behera, S.N., Physica B 262, 3139(1999).Google Scholar
[5] Dahlke, W.E., and Sze, S.M., Solid-State Electron. 10, 865 (1967)Google Scholar
[6] Spanhel, L., Arpac, E., and Schmidt, H., J. Non. Cryst. Solids 147/148, 657 (1992).Google Scholar
[7] Hong, K.J., Jeong, T.S., Yoon, C.J., and Shin, Y.J., J. Crystal. Growth. 218, 19 (2000)Google Scholar
[8] Potter, B.G. Jr and Simmons, J.H., Phys. Rev. B 37, 10838 (1988).Google Scholar
[9] Krishna, M. V Rama, and Friesner, R.A., J. Chem. Phys. 95, 8309 (1991)Google Scholar
[10] Tanaka, M., Qi, J., and Masumoto, Y., J. Crystal Growth 214/215, 410 (2000)Google Scholar
[11] Nosaka, Y., Tanaka, K., and Fujii, N., J. Appl. Polym. Sci. 47, 1773 (1993)Google Scholar