Hostname: page-component-76fb5796d-r6qrq Total loading time: 0 Render date: 2024-04-25T15:07:34.570Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Paramagnetic Resonance and Optical Study of Radiation-Induced Defect Centers in Doped Silica Glasses

Published online by Cambridge University Press:  25 February 2011

Robert N. Schwartz ,
Gregory L. Tangonan ,
G. Richard Blair ,
Walee Chamulitrat  and
Larry Kevan
Robert N. Schwartz
Affiliation:
Hughes Research Laboratories, Malibu, CA 90265
Gregory L. Tangonan
Affiliation:
Hughes Research Laboratories, Malibu, CA 90265
G. Richard Blair
Affiliation:
Hughes Research Laboratories, Malibu, CA 90265
Walee Chamulitrat
Affiliation:
Department of Chemistry, University of Houston, Houston, TX 77004
Larry Kevan
Affiliation:
Department of Chemistry, University of Houston, Houston, TX 77004
Get access

Abstract

Gamma- and UV-induced defect centers in germanium and fluorine doped silica have been studied by electron paramagnetic resonance (EPR) spectroscopy. The complex spectrum at g≃2 in γ-irradiated germanium doped glass corresponds to a superposition of resonances from several germanium E′-centers. In UV-irradiated samples, however, the EPR spectrum is dominated by only one type of germanium E′-centers. Significant spectral simplification of γ-irradiated germanium doped silica can be achieved by heating or broadband photoirradiation. Similar results are observed in multimode germanium doped core optical fibers. UV-induced optical loss spectra in the 0.5–1.5 μm wavelength range were also measured in these core fibers as well as the growth kinetics of the UL-induced absorption. Gamma-irradiation of fluorine doped silica generated two different types of silicon E′-centers, Ea1. At lower radiation dose one sees a mixture of Ea1 and Ea2, but at higher radiation dose Ea2 dominates. A spectrum dominated by the Ea2 variant is also observed in LW-irradiated samples and in photobleached low gamma dose samples.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 61: Symposium P – Defects in Glasses , 1985 , 197
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Friebele, E. J., Askins, C.G., Gingerich, M.E. and Long, K.I., Nucl. Instr. and Meth. B 1, 355 (1984).CrossRefGoogle Scholar
2. Friebele, E. J. and Griscom, D.L., in: Treatise on Materials Science and Technology, Vol.17, Glass II, eds, Tomozawa, M. and Doremus, R. H. (Academic Press, New York, 1979) p. 257.Google Scholar
3. Griscom, D. L., J. Non-Crystalline Solids, 73, 51 (1985).CrossRefGoogle Scholar
4. Blyler, L. L. Jr., DiMarcello, F.V., Simpson, J.R., Sigedty, E.A., Hart, A.C. Jr. and Foertmeyer, V.A., J. Non-Crystalline Solids 38 39, 165 (1980).CrossRefGoogle Scholar
5. Friebele, E. J., Griscom, D.L., and Sigel, G.H. Jr., J. Appl. Phys. 45, 3424 (1974).CrossRefGoogle Scholar
6. Kordas, G., Weeks, R.A., and Kinser, D.L., J. Non-Crystalline Solids 69, 293 (1985).CrossRefGoogle Scholar
7. Itoh, H., Shimizu, M., Ohmori, Y. and Nakamura, M., J. Non-Crystalline Solids 70, 439 (1985).CrossRefGoogle Scholar
8. Chamulitrat, W., Kevan, L., Schwartz, R.N., Blair, G.R., and Tangonan, G.L., submitted to the J. Appl. Phys.Google Scholar
9. Vitko, J. Jr., J. Appl. Phys. 49, 5530 (1978).CrossRefGoogle Scholar
10. Hagon, J. P., Jaros, M. and S-toneham, A.M., J. Phys. C, 18, 4957 (1985).CrossRefGoogle Scholar
11. Gur'yanov, A. N., Gusovskii, D.D., Dianov, E.M., Kornienko, L.S., Nikitin, E.P., Rybaltovskii, A.O., Khopin, V.F., Chernov, P.V. and Yushin, A.S., Soy. J. Quantum Electron. 9, 768 (1979).CrossRefGoogle Scholar
12. Griscom, D. L., Nucl. Instr. and Meth. Bl, 481 (1984).CrossRefGoogle Scholar