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Focused Ion Beam Techniques for Butterfly Wing Scales Analysis and 3-D Reconstruction

Published online by Cambridge University Press:  26 February 2011

Katharine Dovidenko ,
Laurie A. Le Tarte  and
Radislav A. Potyrailo
Katharine Dovidenko
Affiliation:
dovidenk@research.ge.com, GE Global Research Center, MACS, 1 Research Circle, K1 1D39, Niskayuna, NY, 112309, United States, 1-518-387-4759
Laurie A. Le Tarte
Affiliation:
letarte@crd.ge.com, General Electric Global Research Center, 1 Research Circle, Niskayuna, NY, 12309, United States
Radislav A. Potyrailo
Affiliation:
potyrailo@crd.ge.com, General Electric Global Research Center, 1 Research Circle, Niskayuna, NY, 12309, United States
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Abstract

We have developed and successfully demonstrated a protocol for mounting and electrical grounding of a butterfly wing scale using a series of localized electron- and ion-beam assisted Pt depositions in the dual-beam Focused Ion Beam (FIB)-SEM system. This method eliminates introduction of silver paint or other typical mounting materials, along with their chemistries, and produces a stable structure for FIB cross-sectioning, electron imaging, chemical analysis by Energy Dispersive Spectrometry (EDS) and/or Auger Electron Spectroscopy (AES), and FIB milling for 3-D reconstruction.

Keywords

biomaterialAuger electron spectroscopy (AES)scanning electron microscopy (SEM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 983: Symposium LL – Focused Ion Beams for Analysis and Processing , 2006 , 0983-LL03-02
Copyright
Copyright © Materials Research Society 2007

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References

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