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Growth of mirror-like Zn1−xMnxO diluted magnetic semiconductor thin films by r.f. magnetron sputtering method

Published online by Cambridge University Press:  15 March 2011

Sejoon Lee ,
Hye Sung Lee  and
Deuk Young Kim
Sejoon Lee
Affiliation:
Quantum-functional Semiconductor Research Center, Dongguk University3-26 Phil-dong, Chung-gu, Seoul 100-715, KOREA
Hye Sung Lee
Affiliation:
Quantum-functional Semiconductor Research Center, Dongguk University3-26 Phil-dong, Chung-gu, Seoul 100-715, KOREA
Deuk Young Kim*
Affiliation:
Quantum-functional Semiconductor Research Center, Dongguk University3-26 Phil-dong, Chung-gu, Seoul 100-715, KOREA
*
*Corresponding Author. E-mail Address: dykim@dongguk.edu
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Abstract

The Zn1−xMnxO thin films were grown on Al2O3 (0001) substrates by an r.f. magnetron sputtering method. The film grown with employing buffer layer shows mirror-like surface, while the film grown without buffer layer shows the columnar-structured configuration. The mirror-like Zn0.93Mn0.07O thin films have the single crystalline phase with (000ℓ) orientation normal to the substrate surface and show the UV emission originated from the near band-edge-emission for the measurements of x-ray diffraction and photoluminescence, respectively. The mirror-like Zn0.93Mn0.07O film clearly showed a hysteresis loop, which is obvious evidence of ferromagnetism, and the Curie temperature was determined to be 68 K for the characterization of the temperature-dependent magnetization.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 825: Symposium G – Semiconductor Spintronics , 2004 , G5.1
Copyright
Copyright © Materials Research Society 2004

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