Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Nelson, Brent P
Xu, Yueqin
Webb, John D
Mason, Alice
Reedy, Robert C
Gedvilas, Lynn M
and
Lanford, William A
2000.
Techniques for measuring the composition of hydrogenated amorphous silicon–germanium alloys.
Journal of Non-Crystalline Solids,
Vol. 266-269,
Issue. ,
p.
680.
Wang, Qi
Iwaniczko, Eugene
Yang, Jeffrey
Lord, Kenneth
and
Guha, Subhendu
2001.
High Quality Amorphous Silicon Germanium Alloy Solar Cells Made by Hot-wire CVD at 10 Å/s.
MRS Proceedings,
Vol. 664,
Issue. ,
Dalal, Vikram L.
2001.
Some Considerations Relating to Growth Chemistry of Amorphous SI and (SI,GE) Films and Devices.
MRS Proceedings,
Vol. 664,
Issue. ,
Sheng, S.R.
Boshta, M.
Braunstein, R.
and
Dalal, V.L.
2002.
On the electronic transport properties of amorphous (Si,Ge) alloys: charged scattering centers and compositional disorder.
Journal of Non-Crystalline Solids,
Vol. 303,
Issue. 2,
p.
201.
Dalal, Vikram L
2002.
Growth chemistry of amorphous silicon and amorphous silicon–germanium alloys.
Current Opinion in Solid State and Materials Science,
Vol. 6,
Issue. 5,
p.
455.
Sheng, S.R
Sun, G.S
Liebe, J
Kattwinkel, A
Braunstein, R
Nelson, B.P
von Roedern, B
and
Bärner, K
2002.
Electronic properties of hydrogenated amorphous silicon–germanium alloys and long-range potential fluctuations.
Materials Science and Engineering: A,
Vol. 325,
Issue. 1-2,
p.
490.
Xu, Yueqin
Nelson, Brent P.
Williamson, D.L.
Gedvilas, Lynn M.
and
Reedy, Robert C.
2003.
Influence of Filament and Substrate Temperatures on Structural and Optoelectronic Properties of Narrow Gap a-SiGe:H Alloys Deposited by Hot-Wire CVD.
MRS Proceedings,
Vol. 762,
Issue. ,
Xu, Yueqin
Nelson, B.P.
Gedvilas, L.M.
and
Reedy, R.C.
2003.
Improving narrow bandgap a-SiGe:H alloys grown by hot-wire chemical vapor deposition.
Thin Solid Films,
Vol. 430,
Issue. 1-2,
p.
197.
Williamson, D.L
2003.
Microstructure of amorphous and microcrystalline Si and SiGe alloys using X-rays and neutrons.
Solar Energy Materials and Solar Cells,
Vol. 78,
Issue. 1-4,
p.
41.
Soukup, R. J.
Ianno, N. J.
Darveau, Scott A.
and
Exstrom, Christopher L.
2004.
Optical and Electronic Characterization of a-SiGe:H Thin Films Prepared by a Novel Hollow Cathode Deposition Technique.
MRS Proceedings,
Vol. 808,
Issue. ,
Soukup, R.J.
Ianno, N.J.
Pribil, G.
and
Hubicka, Z.
2004.
Deposition of high quality amorphous silicon, germanium and silicon-germanium thin films by a hollow cathode reactive sputtering system.
Surface and Coatings Technology,
Vol. 177-178,
Issue. ,
p.
676.
Soukup, R.J.
Ianno, N.J.
Darveau, Scott A.
and
Exstrom, Christopher L.
2005.
Thin films of a-SiGe:H with device quality properties prepared by a novel hollow cathode deposition technique.
Solar Energy Materials and Solar Cells,
Vol. 87,
Issue. 1-4,
p.
87.
Mahan, A.H.
2006.
An update on silicon deposition performed by hot wire CVD.
Thin Solid Films,
Vol. 501,
Issue. 1-2,
p.
3.
Xu, Yueqin
Mahan, A.H.
Gedvilas, Lynn M.
Reedy, Robert C.
and
Branz, Howard M.
2006.
Deposition of photosensitive hydrogenated amorphous silicon–germanium films with a tantalum hot wire.
Thin Solid Films,
Vol. 501,
Issue. 1-2,
p.
198.
Goerigk, G.
and
Williamson, D. L.
2006.
Temperature induced differences in the nanostructure of hot-wire deposited silicon-germanium alloys analyzed by anomalous small-angle x-ray scattering.
Journal of Applied Physics,
Vol. 99,
Issue. 8,
Fedala, A.
Cherfi, R.
Aoucher, M.
and
Mohammed-Brahim, T.
2006.
Structural, optical and electrical properties of hydrogenated amorphous silicon germanium (a-Si1−xGex) deposited by DC magnetron sputtering at high rate.
Materials Science in Semiconductor Processing,
Vol. 9,
Issue. 4-5,
p.
690.
Arrais, Aldo
Benzi, Paola
Bottizzo, Elena
and
Demaria, Chiara
2009.
Correlations among hydrogen bonding configuration, structural order and optical coefficients in hydrogenated amorphous germanium obtained by x-ray-activated chemical vapour deposition.
Journal of Physics D: Applied Physics,
Vol. 42,
Issue. 10,
p.
105406.
Goerigk, G.
Huber, K.
Mattern, N.
and
Williamson, D. L.
2012.
Quantitative anomalous small-angle X-ray scattering — The determination of chemical concentrations in nano-scaled phases.
The European Physical Journal Special Topics,
Vol. 208,
Issue. 1,
p.
259.
Wang, Chao-Chun
Wuu, Dong-Sing
Lien, Shui-Yang
Lin, Yang-Shih
Liu, Chueh-Yang
Hsu, Chia-Hsum
and
Chen, Chia-Fu
2012.
Characterization of Nanocrystalline SiGe Thin Film Solar Cell with Double Graded-Dead Absorption Layer.
International Journal of Photoenergy,
Vol. 2012,
Issue. ,
p.
1.
Xu, Rui
Li, Wei
He, Jian
Sun, Yan
and
Jiang, Ya-Dong
2013.
Investigation of nanocrystallization of a-Si1−xGex:H thin films diluted with argon in the PECVD system.
Journal of Non-Crystalline Solids,
Vol. 365,
Issue. ,
p.
37.