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Impedance/Dielectric Spectroscopy of Electroceramics in the Nanograin Regime

Published online by Cambridge University Press:  11 February 2011

N. J. Kidner ,
B. J. Ingram ,
Z. J. Homrighaus ,
T. O. Mason  and
E. J. Garboczi
N. J. Kidner
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, IL 60208, U.S.A.
B. J. Ingram
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, IL 60208, U.S.A.
Z. J. Homrighaus
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, IL 60208, U.S.A.
T. O. Mason
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, IL 60208, U.S.A.
E. J. Garboczi
Affiliation:
Materials and Construction Research, Building and Fire Research Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, U. S. A.
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Abstract

In the microcrystalline regime, the behavior of grain boundary-controlled electroceramics is well described by the “brick layer model” (BLM). In the nanocrystalline regime, however, grain boundary layers can represent a significant volume fraction of the overall microstructure and simple layer models are no longer valid. This work describes the development of a pixel-based finite-difference approach to treat a “nested cube model” (NCM), which more accurately calculates the current distribution in polycrystalline ceramics when grain core and grain boundary dimensions become comparable. Furthermore, the NCM approaches layer model behavior as the volume fraction of grain cores approaches unity (thin boundary layers) and it matches standard effective medium treatments as the volume fraction of grain cores approaches zero. Therefore, the NCM can model electroceramic behavior at all grain sizes, from nanoscale to microscale. It can also be modified to handle multi-layer grain boundaries and property gradient effects (e.g., due to space charge regions).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 756: Symposia EE/FF – Solid-State Ionics – Materials for Fuel Cells and Fuel Processors , 2002 , EE4.6
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1. Chiang, Y.–M.,, J. Electroceram. 1 (3), 205 (1997).Google Scholar
2. Dudney, N.J., Ann. Rev. Mater. Sci. 19, 103 (1989).Google Scholar
3. Maier, J., Prog. Solid State Chem. 23, 171 (1995).Google Scholar
4. Maier, J., Ber. Busenges. Phys. Chem. 90, 26 (1986).Google Scholar
5. Beekmans, N.M. and Heyne, L., Electrochim. Acta 21, 303 (1976).Google Scholar
6. van Dijk, T. and Burggraaf, A.J., Phys. Stat. Solidi A 63, 229 (1981).Google Scholar
7. Verkerk, M.J., Middlehuis, B.J., and Burggraaf, A.J., Solid State Ionics 6, 159 (1982).Google Scholar
8. Boukamp, B.A., “Equivalent Circuit (EQUIVCRT.PAS),” University of Twente, The Netherlands (1990).Google Scholar
9. Bonanos, N., Steele, B.C.H., Butler, E.P., Johnson, W.B., Worrell, W.L., Macdonald, D.D., and McKubre, M.C.H., in Impedance Spectroscopy: Emphasizing Solid Materials and Systems, edited by Macdonald, J.R., (Wiley and Sons, New York, 1987) pp. 191–205.Google Scholar
10. Näfe, H., Solid State Ionics 13, 255 (1984).Google Scholar
11. Hwang, J.–H., McLachlan, D.S., and Mason, T.O., J. Electroceram. 3 (1), 7 (1999).Google Scholar
12. Kim, S. and Maier, J., J. Electrochem. Soc., preprint.Google Scholar
13. McLachlan, D.S., Hwang, J.–H., and Mason, T.O., J. Electroceram. 5 (1), 37 (2000).Google Scholar
14. Wagner, K.M., in Arkiv Electrotechnik, edited by Schering, H., (Springer-Verlag, Berlin, 1914).Google Scholar
15. Maxwell, J.C., A Treatise on Electricity and Magnetism, 2nd ed. (Clarendon Press, Oxford, 1881).Google Scholar
16. Hashin, Z. and Shtrikman, S., J. Appl. Phys. 33, 3125 (1962).Google Scholar
17. Fleig, J. and Maier, J., J. Electrochem. Soc. 145, 2081 (1998).Google Scholar
18. Fleig, J. and Maier, J., J. Eur. Ceram. Soc. 19, 693 (1999).Google Scholar
19. Hagenbeck, R. and Waser, R., Ber. Busenges. Phys. Chem. 101, 1238 (1997).Google Scholar
20. Zuzovsky, M. and Brenner, H., J. Appl. Math. Phys. 28, 979 (1977).Google Scholar
21. Garboczi, E.J., NIST Internal Report 6269 (1998). Also available at http://ciks.cbt.nist.gov/monograph/, Chap. 2.Google Scholar
22. Douglas, J.F. and Garboczi, E.J., in Adv. Chem. Phys., Vol. XCI, edited by Prigogine, I. and Rice, S.A., (Wiley & Sons, 1995), p. 85.Google Scholar
23. Mason, T.O., Hwang, J.–H., Mansourian-Hadavi, N., Gonzalez, G.B., Ingram, B.J., and Homrighaus, Z.J., in Nanocrystalline Metals and Oxides: Selected Properties and Applications, edited by Kauth, P. and Schoonman, J., (Kluwer Academic Publishers, Norwell, MA, 2002), p. 111.Google Scholar