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Low-Energy Ion Scattering Measurements from an Al-Pd-Mn Quasicrystal

Published online by Cambridge University Press:  17 March 2011

R. Bastasz ,
C. J. Jenks ,
T. A. Lograsso ,
A. R. Ross ,
P. A. Thiel  and
J. A. Whaley
R. Bastasz
Affiliation:
Sandia National Laboratories, Livermore, CA 94551, U.S.A.
C. J. Jenks
Affiliation:
Ames Laboratory Department of Chemistry
T. A. Lograsso
Affiliation:
Ames Laboratory Department of Materials Science and Engineering, Iowa State University, Ames, IA 50011, U.S.A.
A. R. Ross
Affiliation:
Ames Laboratory Department of Materials Science and Engineering, Iowa State University, Ames, IA 50011, U.S.A.
P. A. Thiel
Affiliation:
Ames Laboratory Department of Chemistry
J. A. Whaley
Affiliation:
Sandia National Laboratories, Livermore, CA 94551, U.S.A.
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Abstract

Energy-angle distributions of low-energy inert-gas ions scattered from surfaces provide information about surface composition and structure. We have measured energy spectra of He+ scattered from an Al71Pd20Mn9 quasicrystal, which was oriented perpendicular to the 5-fold axis, along various azimuthal directions. Strong scattering signals are seen from Al and Pd, but only a weak Mn signal is observed. From measurements made of He+ at an oblique angle of incidence scattered in the forward direction, we observe a 72° periodicity in the azimuthal dependence of the scattering signal intensity from Al surface atoms. The effect arises from shadowing effects involving neighboring surface atoms and provides direct evidence that Al surface atoms exist in a local environment with 5-fold symmetry. In addition, measuring the variation of the signal intensity with incidence angle provides information about neighboring atom distances, which compare favorably with a model of the quasicrystal surface derived from the bulk structure.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 643: Symposium K – Quasicrystals-Preparation, Properties, and Applications , 2000 , K11.1
Copyright
Copyright © Materials Research Society 2001

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References

1. Niehus, H., in Practical Surface Analysis. Vol. 2: Ion and Neutral Spectroscopy, edited by Briggs, D. and Seah, M. P. (Wiley, Chichester, 1992), p. Chapter 9.Google Scholar
2. Williams, R. S., in Low-Energy Ion Surface Interactions, edited by Rabalais, J. W. (Wiley, Chichester, 1994), p. Chapter 1.Google Scholar
3. Taglauer, E., in Surface Analysis - The Principal Techniques, edited by Vickerman, J. C. (Wiley, Chichester, 1997), p. Chapter 6.Google Scholar
4. Miedema, A. R., Metallk, Z.. 69, 455–461 (1978).Google Scholar
5. Ossi, P. M., Surf. Sci. 201, L519–L531 (1988).Google Scholar
6. Mazurowski, J. and Dowben, P. A., in Surface Segregation Phenomena, edited by Dowben, P. A. and Miller, A. (CRC Press, Boca Raton, 1990), p. 365–419.Google Scholar
7. Stephens, P. W. and Goldman, A. I., Scientific American, 24–31 (April 1991).Google Scholar
8. Goldman, A. I. and Widom, M., Annu. Rev. Phys. Chem. 42, 685–729 (1991).Google Scholar
9. Schaub, T. M., Bürgler, D. E., Güntherodt, H.-J., et al. in Conf. Proc. ICQ5, 1995).Google Scholar
10. Schaub, T. M., Bürgler, D. E., Güntherodt, H.-J., et al. Appl. Phys. A 61, 491–501 (1995).Google Scholar
11. Shen, Z., Jenks, C. J., Anderegg, J., et al. Phys. Rev. Lett. 78, 1050–1053 (1997).Google Scholar
12. Gierer, M., Hove, M. A. Van, Goldman, A. I., et al. Phys. Rev. Lett. 78, 467–470 (1997).Google Scholar
13. Gierer, M., Hove, M. A. Van, Goldman, A. I., et al. Phys. Rev. B 57, 7628–7641 (1998).Google Scholar
14. Shen, Z., Raberg, W., Heinzig, M., et al. Surf. Sci. 450, 1–11 (2000).Google Scholar
15. Schaub, T. M., Bürgler, D. E., Güntherodt, H.-J., et al. Phys. Rev. Lett. 73, 1255–1258 (1994).Google Scholar
16. Ebert, P., Feuerbacher, M., Tamura, N., et al. Phys. Rev. Lett. 77, 3827–3830 (1996).Google Scholar
17. Shen, Z., Stoldt, C. R., Jenks, C. J., et al. Phys. Rev. B 60, 14688–14694 (1999).Google Scholar
18. Ledieu, J., Munz, A., Parker, T., et al. Surf. Sci. 433–435, 666–671 (1999).Google Scholar
19. Zurkirch, M., Atrei, A., Erbudak, M., et al. Phil. Mag. Lett. 73, 107–114 (1996).Google Scholar
20. Zurkirch, M., Erbudak, M., Hochstrasser, M., et al. Surf. Rev. Lett. 4, 1143–1148 (1997).Google Scholar
21. Alvarez, J., Calvayrac, Y., Jouland, J. L., et al. Surf. Sci. 423, L251–L257 (1999).Google Scholar
22. Capitan, M. J., Calvayrac, Y., Gratias, D., et al. Physica B 283, 79–83 (2000).Google Scholar
23. Naumovic, D., Aebi, P., Schlapbach, L., et al. in New Horizons in Quasicrystals: Research and Applications, edited by Goldman, A. I., Sordelet, D., Thiel, P. A. and Dubois, J.-M. (World Scientific, Ames, IA, 1997), pp. 86–94.Google Scholar
24. Naumovic, D., Aebi, P., Schlapbach, L., et al. in Proceedings of the 6th International Conference on Quasicrystals, edited by Takeuchi, S. and Fujiwara, T. (World Scientific, Tokyo, 1998), pp. 749–756.Google Scholar
25. Naumovic, D., Aebi, P., Schlapbach, L., et al. in Phys. Rev. B 60, R16330–R16333 (1999).Google Scholar
26. Bastasz, R., Felter, T. E., and Ellis, W. P., Phys. Rev. Lett. 63, 558–561 (1989).Google Scholar
27. Delaney, D. W., Bloomer, T. E., and Lograsso, T. A., in New Horizons in Quasicrystals: Research and Applications, edited by Goldman, A. I., Sordelet, D. J., Thiel, P. A. and Dubois, J. M. (World Scientific, Ames, IA, 1997), p. 45–52.Google Scholar
28. Shen, Z., Kramer, M. J., Jenks, C. J., et al. Phys. Rev. B 58, 9961–9971 (1998).Google Scholar
29. Jenks, C. J., Delaney, D. W., Bloomer, T. E., et al. Appl. Surf. Sci. 103, 485–493 (1996).Google Scholar
30. Jenks, C. J., Bloomer, T. E., Kramer, M. J., et al. (to be submitted).Google Scholar
31. Brundle, C. R., in Industrial Applications of Surface Analysis, edited by Casper, L. A. and Powell, C. J. (American Chemical Society, Washington, D.C., 1982), p. 13–32.Google Scholar
32.“The Stopping and Range of Ions in Solids,” Ziegler, J. F., Biersack, J. P., and Littmark, U. (Pergamon Press, New York, 1985, ISBN: 0-08-021603-X) 321 pp.Google Scholar
33. Oen, O. S., Surf. Sci. 131, L407 (1983).Google Scholar
34. Jenks, C. J., Burnett, J.W., Delaney, D.W., Lograsso, T. A. and Thiel, P. A. Appl. Surf. Sci. 157, 23–28 (2000).Google Scholar
35. Bastasz, R., Jenks, C. J., and Whaley, J. A., unpublished results.Google Scholar
36. Boudard, M., Boissieu, M. de, Janot, C., et al. J. Phys.: Condens. Matter 4, 10149 (1992).Google Scholar
37. Bastasz, R., Whaley, J. A., and Ellis, W. P., Surf. Rev. Lett. 6, 605–611 (1999).Google Scholar