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Mechanism of Interdiffusion in Hg1-XXxTe/CdTe Superlattices (X = Cd, Mn, AND Zn)

Published online by Cambridge University Press:  25 February 2011

J.-L. Staudenmann
Affiliation:
Department of Physics, Ames Laboratory-USDOE and Iowa State University, Ames, Iowa 50011J.-L. S. current address : Howard Hughes Medical Institute, Department of Biochemistry & Molecular Biophysics, Columbia University, 630 West 168th Street, New York, NY 10032
R. D. Knox
Affiliation:
Department of Physics, Ames Laboratory-USDOE and Iowa State University, Ames, Iowa 50011J.-L. S. current address : Howard Hughes Medical Institute, Department of Biochemistry & Molecular Biophysics, Columbia University, 630 West 168th Street, New York, NY 10032
J.-P. Faurie
Affiliation:
Department of Physics, University of Illinois at Chicago, P.O. Box 4348, Chicago, Illinois 60680
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Abstract

The interdiffusion mechanism in Hg(l-x)X(x)Te/CdTe superlattices where X is Cd, Mn, or Zn can be deduced from the magnitude of the interdiffusion activation energy. By comparing in-situ x-ray diffraction measurements (our work) with results from Tang and Stevenson (J. Vac. Sci. Technol. AS, 1987), it is found that anionic and cationic Frenkel pairs represent the most likely interdiffusion mechanism in Hg(l-x)X(x)Te/CdTe superlattices. This model mixes vacancies and interstitials, as well as maintaining the conduction type and the electronic mobility. It is further shown that interdiffusion sets in as soon as the growth starts.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

Ames Laboratory is operated by the US Department of Energy by Iowa State University under contract No. W-7405-Eng-82. This work was supported by the Director for Energy Research, Office of Basic Energy Sciences.Google Scholar
1. Smith, D.L., McGill, T.C., and Schulman, J.N., Appl. Phys. Lett. 43, 180 (1983).Google Scholar
2. Faurie, J.-P., Million, A., and Piaquet, J., Appl. Phys. Lett. 41, 713 (1982).Google Scholar
3. - Arch, D.K., Staudenmann, J.-L., and Faurie, J.-P., Appl. Phys. Lett. 4A, 1588 (1986); D.K. Arch, J.-L. Staudenmann, and Appl. Phys. Lett. 49, 745 (1986).Google Scholar
- Arch, D.K., Faurie, J.-P., Staudenmann, J.-L., Hibbs-Brenner, M., and chow, P., J. Vac. Sci. Technol. A4, 2101 (1986).Google Scholar
4. Staudenmann, J.-L., Horning, R.D., Knox, R.D., Faurie, J.-P., Reno, J., Sou, I.K., and Arch, D.K., Trans. Met. AIME, 1986, “In-Situ Interdiffusion Measurements in HgTe-CdTe Superlattices,” in Semiconductor Based Heterostructures : Interfacial Structure and Stability, edited by Green, M.L., Baglin, J.E.E., Chin, G.Y., Deokman, H.W., Mayo, W., and Narasinham, D.. A publication of the Metallurgical Society, Inc., Warrendale, PA 15086, 1986. p. 41.Google Scholar
5. Gorshkov, A.V., Zaitov, F.A., Shangin, S.B., Shalyapina, G.M., Petrov, I.N., and Asaturova, I.S., Soy. Phys. Solid State 26, 17871791 (1984).Google Scholar
6. Spicer, W.E., Silberman, J.A., Lindau, I., Chen, A.B., Sher, A., and Wilson, J. A., J. Vac. Sci. Technol. A1, 1735 (1983).Google Scholar
7. Sher, A., Chen, A.B., Spicer, W.E., and Shih, C.K., J. Vac. Sci. Technol. A3, 105 (1985).Google Scholar
8. Sivananthan, S., Chu, X., and Faurie, J.-P., Appl. Phys. Lett., to be published.Google Scholar
9. Staudenmann, J.-L., Knox, R.D., and Faurie, J.-P., J. Vac. Sol. Technol. A5, 1987, in the press.Google Scholar
10. Sapoval, B., Rosso, M., and Gouyet, J.-F., J. Physique Lett. 46, L149 (1985).Google Scholar
11. Zanio, K.R., J. Vac. Sci. Technol. A4, 21062109 (1986).Google Scholar
12. Tang, M.F.S. and Stevenson, D.A., J. Vac. Sci. Technol. A5, 1987, in the press.Google Scholar
13. Fleming, R.M., McWhan, D.B., Gossard, A.C., Wiegman, W., and Logan, R.A., J. Appl. Phys. 51, 357 (1980).Google Scholar
14. McWhan, D.B., “Structure of Chemically Modulated Films,” in Synthetic Modulated Structures edited by Chang, L.L. and Giessen, B.C., Academic Press, New York, 1985, pp. 4567.Google Scholar
15. Reno, J., Sou, I.K., Wijewarnasurya, P.S., and Faurie, J.-P., Appl. Phys. Lett. 48, 1069 (1986).Google Scholar
16. Chu, X., Sivananthan, S. and Faurie, J.-P., Appl. Phys. Lett. 50, 597 (1987).Google Scholar
17. Sapoval, B., Rosso, M., Gouyet, J.-F., and Colonna, J.-F., Solid State Ionics 18 & 19, 21 (1986).Google Scholar