Hostname: page-component-8448b6f56d-dnltx Total loading time: 0 Render date: 2024-04-24T07:14:17.043Z Has data issue: false hasContentIssue false
  • English
  • Français

Microtomy of Large Particle Zeolites for Tem

Published online by Cambridge University Press:  16 February 2011

J. G. Ulan ,
C. Schooley  and
R. Gronsky
J. G. Ulan
Affiliation:
National Centerfor Electron Microscopy, Materials and Chemical Science Division, Lawrence Berkeley Laboratory, 1 Cyclotron Rd. Berkeley California 94720
C. Schooley
Affiliation:
University of California, Berkeley, Electron Microscope Laboratory, 26 Giannini Hall, Berkeley, California 94720
R. Gronsky
Affiliation:
National Centerfor Electron Microscopy, Materials and Chemical Science Division, Lawrence Berkeley Laboratory, 1 Cyclotron Rd. Berkeley California 94720
Get access

Abstract

Uniformly thin specimens of powders, suitable for electron microscopy, can be prepared by ultramicrotomy. There is a size limit to the particles that can be studied since larger particles tend to be dislodged from the available resins when microtomed. A method is described to strengthen the binding of the organic resin to the inorganic zeolite, allowing large particles to be sectioned. The particle size limit increased from 3 μm to greater than 20 gim in diameter for FeZSM-5 aggregates. This method can be applied to a variety of oxide powder samples, extending the utility of microtomy as a materials science tool.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 199: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials II , 1990 , 153
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Csencsits, R., Schooley, C., and Gronsky, R., J. Electron. Microsc. Tech. 2, 643 (1985).Google Scholar
2. Dow Coming Product Bulletin 23–012B (1985).Google Scholar
3. Swab, P., and Klinger, R. E., in Snecimen Preparation for Transmission Electron Microscony of Materials, edited by Bravman, J. C., Anderson, R. M., and McDonald, M. L. (Mat. Res. Soc. Proc. 115. Pittsburge, PA 1988) pp. 229–234.Google Scholar
4. Glauert, A. M..Practical Methods in Electron Microscopy Vol.3 edited by Glauert, A. M (American Elsevier, New York, N.Y. 1974) pp. 130–147.Google Scholar
5. Glauert, A. M., Proc. Royal Microsc. Soc. 22, 264.(1987).Google Scholar