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Performing Accurate Cathodoluminescence Measurements of Phosphor Powders and Screens

Published online by Cambridge University Press:  10 February 2011

L. E. Shea  and
R. J. Walko
L. E. Shea
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-0527
R. J. Walko
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-0527
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Abstract

In the field of display phosphors, the efficiency of the cathodoluminescence process is a characteristic that is often used to assess the potential of a phosphor for use in flat-panel display applications such as field emission displays (FEDs). Cathodoluminescence characterization in a demountable vacuum chamber is important for preliminary evaluation and lifetesting of phosphor powders and screens prior to incorporation into an actual display device. There are many experimental factors that influence accurate measurement and calculation of the cathodoluminescence efficiency. These include electron beam profile (uniform, Gaussian), current density, electron accelerating voltage, secondary electron collection, and optical detection system. This paper will present some methods for achieving improved accuracy of cathodoluminescence measurements in systems at Sandia National Laboratories, using Y2O3:Eu as a representative phosphor.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 560: Symposium E – Luminescent Materials , 1999 , 127
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1. Ozawa, L., Cathodoluminescence, (VCH Publishers, New York, 1990), p. 3.Google Scholar
2. Shea, L. E., The Electrochemical Society Interface, 7 [2], 24 (1998).Google Scholar
3. Seager, C. H., Warren, W. L., and Tallant, D. R., J. Appl. Phys., 81, 7994 (1997).Google Scholar
4. Shea, L. E. and Walko, R. J., Proc. of SPIE, (1999), in press.Google Scholar
5. Williams, F., in American of Institute of Physics Handbook, 3ed. (McGraw-Hill Book Company, New York, 1972), p. 9.184.Google Scholar