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Pressure Dependence of Electron Density Distribution of Ferroielectric KNbO3 Polymorphs by Maximum Entropy Method (MEM) Using Single Crystal Diffraction Study

Published online by Cambridge University Press:  26 February 2011

Takamitsu Yamanaka
Affiliation:
t.yamanaka@kce.biglobe.ne.jp, Osaka University, Earth and Space Science, 1-1 Machikaneyama, Toyonaka, 560-0043, Japan, +81-45-785-7878, +81-45-785-7878
Taku Okada
Affiliation:
okatak@ess.sci.osaka-u.ac.jp, Osaka University, Earth and Space Science, 1-1 Machikaneyam, Toyonaka, 560-0043, Japan
Yuki Nakamoto
Affiliation:
nakamoto@cqst.osaka-u.ac.jp, Osaka University, Kyokugen Extreme Research Center, 1-3 Machikaneyama, Toyonaka, 560-0043, Japan
Kenji Ohi
Affiliation:
ohi@ess.sci.osaka-u.ac.jp, Osaka University, Earth and Space Science, 1-1 Machikaneyama, Toyonaka, 560-0043, Japan
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Abstract

Single-crystal structure analysis of KNbO3 has been executed under high pressure through diamond anvil cell installed in the four-circle diffractometer using synchrotron radiation at Photon Factory, KEK in order to clarify the dielectric property. KNbO3 has three structural transitions with increasing pressure at ambient temperature: from orthorhombic structure with the space group Cm2m (Amm2) to tetragonal structure (P4mm) at about 7.0 GPa, to cubic structure (Pm3m) at about 10.0 GPa. The highest-pressure cubic phase is paraelectric, and the other two phases are ferroelectric. The dielectric changes in KNbO3 are clarified by the successive pressure-change of the electron density distribution observed by maximum entropy method (MEM) using high-pressure diffraction data. The MEM electron density maps suggest that the tetragonal phase designates the largest polarization among three polymorphs. The maps also indicate that the localization of the valence electron around the cation position is more enhanced under higher pressure.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Shirame, G., Danner, H., Pavlovic, A., Repinsky, R., Phys. Rev. 93, 672 (1954).Google Scholar
2. Gourdain, D., Moya, E., Chervin, J. C., Canny, B., and Pruzan, Ph., Phys. Rev. B 52, 3180 (1995).Google Scholar
3. Shamin, M., and Ishidate, T., Solid State Commun. 113, 713 (2000).Google Scholar
4. Shen, Z. X.., Hu, Z. P., Chong, T. C., Beh, C. Y., Tang, S. H., and Kouok, M. H., Phys. Rev. B 52, 3976 (1995).Google Scholar
5. Moya, E., Tinoco, T., Polian, A., and Itie, J. P., Ferroelectric Lett. 22, 59 (1997).Google Scholar
6. Chervin, J. C., Itie, J. P., Gourdain, D., and Pruzan, Ph., Solid State Comm. 110, 247 (1999).Google Scholar
7. Frenkel, A. I., Wang, F. M., Kelly, S., Ingalls, R., Haskel, D., Stern, E. A., and Tocoby, Y., Phys. Rev. B 56, 10869 (1997).Google Scholar
8. Kobayashi, Y., Endo, S., Deguchi, K., Ming, L. C., and Zou, G., Solid State Com. 120, 515 (2001).Google Scholar
9. Yamanaka, T., and Fukuda, T., Phys. Chem. Miner. 29, 633 (2002)Google Scholar
10. Yamanaka, T., Fukuda, T., Hattori, T., and Sumiya, H., Rev. Sci. Inst. 42, 1458 (2001)Google Scholar
11. Mao, H. K., Xu, J., and Bell, P. M., J. Geophys. Res. 91, 4673 (1986).Google Scholar
12. Jaynes, E. T., IEEE Transactions on Systems Science and Cybernetics SSC4 227 (1968)Google Scholar
13. Collins, D. M., Nature 298, 4951 (1982)Google Scholar
14. Sakata, M., and Sato, M., Acta Cryst. A46, 263 (1990).Google Scholar
15. Sakata, M., Uno, T., Takata, M., and Moriet, R., Acta Cryst. B48, 591 (1992).Google Scholar
16. Vries, R. Y., Briels, W. J. de, and Feil, D., Acta Cryst. A50, 383 (1994)Google Scholar
17. Yamamoto, K., Takahashi, Y., Ohshima, K., and Yukino, K., Acta Cryst. A52, 606 (1996)Google Scholar
18. Yamanaka, T., Okada, T., Komatsu, Y., and Nomori, H., J. Synchrotron Rad. 12, 566 (2005)Google Scholar