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Self-Organization of Nitrogen-Containing Polymeric Supramolecules in Thin Films

Published online by Cambridge University Press:  21 March 2011

Matti Knaapila
Affiliation:
Department of Engineering Physics and Mathematics, Helsinki University of Technology, P.O. Box 2200, FIN-02015 HUT, Espoo, Finland
Mika Torkkeli
Affiliation:
Department of Physics, University of Helsinki, P.O. Box 9, FIN-00014, Helsinki, Finland
Tapio Mäkelä
Affiliation:
VTT Electronics, Microelectronics, Technical Research Centre of Finland, P. O. Box 1101, FIN-02044 VTT, Espoo, Finland
Lockhart Horsburgh
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, United Kingdom
Klas Lindfors
Affiliation:
Department of Engineering Physics and Mathematics, Helsinki University of Technology, P.O. Box 2200, FIN-02015 HUT, Espoo, Finland
Ritva Serimaa
Affiliation:
Department of Physics, University of Helsinki, P.O. Box 9, FIN-00014, Helsinki, Finland
Matti Kaivola
Affiliation:
Department of Engineering Physics and Mathematics, Helsinki University of Technology, P.O. Box 2200, FIN-02015 HUT, Espoo, Finland
Andrew P. Monkman
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, United Kingdom
Gerritten Brinke
Affiliation:
Materials Science Centre, Dutch Polymer Institute, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The, Netherlands
Olli Ikkala*
Affiliation:
Department of Engineering Physics and Mathematics, Helsinki University of Technology, P.O. Box 2200, FIN-02015 HUT, Espoo, Finland
*
Corresponding Author: Email: Olli.Ikkala@hut.fi
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Abstract

Rigid rod-like poly(2,5-pyridinediyl), semi-rigid polyaniline and flexible poly(4- vinylpyridine) are nitrogen-containing polymers that with selected amphiphilic oligomers form self-organized comb-shaped supramolecules due to protonation, hydrogen bonding and polar- nonpolar effects combined. Luminescent or conductive ordered structures are demonstrated in thin films. The structures are characterized using small-angle x-ray scattering (SAXS) and grazing-incidence small-angle x-ray scattering (GISAXS). The uniformity is studied using atomic force microscopy and scanning near-field optical microscopy (SNOM).

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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