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Structural and Phase Transformations During Crystallization of Pd43Ni10Cu27P20 Metallic Glass

Published online by Cambridge University Press:  17 March 2011

Evgenia Pekarskaya
Affiliation:
Keck Laboratory of Engineering Materials California Institute of Technology Pasadena, CA, 91125, USA
Jan Schroers
Affiliation:
Keck Laboratory of Engineering Materials California Institute of Technology Pasadena, CA, 91125, USA
William L. Johnson
Affiliation:
Keck Laboratory of Engineering Materials California Institute of Technology Pasadena, CA, 91125, USA
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Abstract

Crystallization of the Pd43Ni10Cu27P20 amorphous alloy during isothermal annealing in the undercooled temperature region is studied by electron microscopy and diffrential scanning calorimetry (DSC). It is established that different crystallization processes take place above and below the nose temperature of the time-temperature-transformation (TTT) diagram. Detailed analysis of the microstructural evolution at the early stages of the crystallization is performed. In addition, the stable phases in the Pd-Ni-Cu-P system are identified.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

1. Nishiyama, N., Inoue, A., Mat. Trans. JIM 37 (10), 15311539 (1996).Google Scholar
2. Schroers, J., Johnson, W.L., and Busch, R., Appl. Phys. Lett. 77, 1158 (2000).Google Scholar
3. Nishiyama, N., Inoue, A. in Bulk metallic glasses, edited by Johnson, W.L., Liu, C.T. and Inoue, A. (Mater. Res. Soc. Proc., 554, 1999) pp. 125130; Acta Mater. 47, 1487 (1999).Google Scholar
4. Schroers, J., Löffler, J.F., Pekarskaya, E., Busch, R., Johnson, W.L. Mat. Sci. Forum, in press.Google Scholar
5. Hirsch, P., Howie, A.et.al, Electron microscopy of thin crystals (R. E. Krieger publishing Co., 1977) p. 563.Google Scholar
6. Greer, A.L., Metall. & Mater. Trans. 27A, 549 (1996).Google Scholar
7. Inoeu, A., Nishiyama, N., Mater. Sci. & Eng. A226–A228, 401 (1997).Google Scholar
8. Löffler, J.F., Schroers, J., and Johnson, W.L., Appl. Phys. Lett. 77 (5), 681683 (2000).Google Scholar