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Studies of Molecular Orientation in Deformed Semicrystalline Polymers by X- Ray Scattering Employing Synchrotron Radiation

Published online by Cambridge University Press:  26 February 2011

S. Röber ,
R. Gehrke  and
H. G. Zachmann
S. Röber
Affiliation:
Institut für Technische und Makromolekulare Chemie der Universität Hamburg
R. Gehrke
Affiliation:
Institut für Technische und Makromolekulare Chemie der Universität Hamburg
H. G. Zachmann
Affiliation:
Institut für Technische und Makromolekulare Chemie der Universität Hamburg
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Introduction

The possibility of using synchrotron radiation as a source of X-rays for scattering experiments has considerably improved the methods of the characterisation of the molecular orientation and molecular order in polymers. In another publication [1], it has been shown that the morphology of ultra highly drawn polyethylene is correlated to the kinetics of isothermal melting, as determined by X- ray scattering employing synchrotron radiation. In this paper we present some results on chain orientation and orientation of crystal lamellae surfaces in uniaxially and biaxially drawn films of polyethyleneterephthalate (PET). These results were obtained by inserting a pole figure goniometer into the synchrotron radiation beam and measuring the wide angle X-ray scattering (WAXS) and small angle X- ray scattering (SAXS) with different angles of incidence of the primary beam onto the sample.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 79: Symposium F – Scattering, Deformation and Fracture in Polymers , 1986 , 205
Copyright
Copyright © Materials Research Society 1987

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References

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