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Surface Potential and Surface Photovoltage of Oxide and Nitride coated multicrystalline Silicon Solar Cells using a Scanning Kelvin Probe

Published online by Cambridge University Press:  21 March 2011

Iain D. Baikie
Iain D. Baikie*
Affiliation:
Kelvin Research Laboratory, KP Technology Ltd, Milton House, Wick, KW1 5LE, UK. email: Iain@Kelvinprobe.com
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Abstract

We have applied a high resolution scanning Kelvin probe to perform dark surface potential topographies of multicrystalline silicon solar cells having thin coatings of Si3N4 and SiO2. We clearly observe the electrical characteristics of the screen printed bus-bar and associated fingers, grain boundaries, together with characteristic structures on the oxide and nitride, coupled to significant surface potential variations across larger sections of the wafer. Associated surface photovoltage measurements can be unambiguously decoded to show coating and bulk contributions. The nitride coating exhibits carrier trapping lifetimes in excess of 13 minutes at 300K.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 808: Symposium A – Amorphous and Nanocrystaline Silicon Science and Technology-2004 , 2004 , A9.12
Copyright
Copyright © Materials Research Society 2004

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References

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