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Tip-Sample Forces in Atomic Force Microscopy: Interplay between Theory and Experiment

Published online by Cambridge University Press:  15 May 2013

Sergey Belikov ,
John Alexander ,
Craig Wall  and
Sergei Magonov
Sergey Belikov
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
John Alexander
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
Craig Wall
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
Sergei Magonov
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
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Abstract

Several examples of Atomic Force Microscopy imaging in the oscillatory resonant and non-resonant modes are analyzed with a theoretical description of tip-sample force interactions. The problems of high-resolution imaging and compositional mapping of heterogeneous polymers are considered. The interplay with theory helps the experiment optimization and rational understanding of the image contrast.

Keywords

scanning probe microscopy (SPM)simulationpolymer
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1527: Symposium UU – Scanning Probe Microscopy―Frontiers in Nanotechnology , 2013 , mrsf12-1527-uu02-04
Copyright
Copyright © Materials Research Society 2013 

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References

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