Low- and wide-angle X-Ray scattering methods were applied to determine the size of structural inhomogeneities in the surface and internal layers of silicate glass.
The functions of radial and cylindrical distribution of electron density in oxide glass, determined by Fourier-Bessel transformation method, were applied.
The corrected structural parameters (mainly distances and packing coefficients) were obtained enabling preliminary determination of the most probable space model of glass. Structural inhomogeneities appearing due to defects and local distortions of the components of elementary space structure of glass, were determined.
The method was applied in investigation of SiO2 in form of quartz glass and gel as well as the system SiO2-H2 O (hydrated gel). Them, it was transformed to investigation of a complex oxide glass (SiO2 -Na2 O-CaO-MgO-R2 O3).
In result of the analysis we obtained the structural parameters of glass (a1, a2, a3, … , an; Zcl, Zc2, Zc3, …, Zcn) as well as the parameters describing degree of crystallization, concentration and size of inhomogeneities.