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The adaptation of a Philips PW1050 X-ray diffractometer system to incorporate an incident beam focusing monochromator: Design, assembly and characterisation

  • I. C. Madsen (a1), R. J. Hill (a1) and G. Stereff (a1)
Abstract

A conventional vertical powder diffractometer has been adapted to allow the collection of high-resolution, single-wavelength diffraction data using Co, Cu or Mo radiation. The major modifications are (i) incorporation of an incident beam focusing monochromator attached to the tube shield, (ii) a variable tilt angle of the tube shield to provide a horizontal beam path through the diffractometer (for ease of alignment), (iii) mounting of the entire diffractometer on a single, very stable base-plate, with micrometer-controlled adjustment of the orientation, (iv) inclusion of a knife-edge, micrometer-controlled focusing slit, and (v) use of a range of Soller slits with acceptance angles down to 1.5° 2φ. The performance of the instrument compares favourably with conventional non-monochromated diffractometer data collected from SRM660 LaB6 and monoclinic ZrO2. In particular, the peaks are more symmetric and have narrower widths, and the peak-to-background ratio is much higher, leading to much superior resolution and profile shapes for structure solution and Rietveld refinement.

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Powder Diffraction
  • ISSN: 0885-7156
  • EISSN: 1945-7413
  • URL: /core/journals/powder-diffraction
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