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Introduction to two-dimensional X-ray diffraction

  • Bob Baoping He (a1)
  • DOI: http://dx.doi.org/10.1154/1.1577355
  • Published online: 06 March 2012
Abstract

Two-dimensional X-ray diffraction refers to X-ray diffraction applications with two-dimensional detector and corresponding data reduction and analysis. The two-dimensional diffraction pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer. In order to take advantage of two-dimensional diffraction, new theories and approaches are necessary to configure the two-dimensional X-ray diffraction system and to analyze the two-dimensional diffraction data. This paper is an introduction to some fundamentals about two-dimensional X-ray diffraction, such as geometry convention, diffraction data interpretation, and advantages of two-dimensional X-ray diffraction in various applications, including phase identification, stress, and texture measurement.

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a)Electronic mail: bhe@bruker-axs.com
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This list contains references from the content that can be linked to their source. For a full set of references and notes please see the PDF or HTML where available.

S. N. Sulyanov , A. N. Popov , and D. M. Kheiker (1994). “Using a two-dimensional detector for X-ray powder diffractometry,” J. Appl. Crystallogr. JACGAR 27, 934942. acr, JACGAR 0021-8898

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Powder Diffraction
  • ISSN: 0885-7156
  • EISSN: 1945-7413
  • URL: /core/journals/powder-diffraction
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