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Stellar spectrophotometry with a microcomputer based, intensified, silicon vidicon

Published online by Cambridge University Press:  04 August 2017

S. Jeffers  and
T. Stiff
S. Jeffers
Affiliation:
Physics Dept. and Centre for Research in Experimental Space Science, York University, 4700 Keele St., North York, Ontario, Canada, M3J 1P3
T. Stiff
Affiliation:
Physics Dept. and Centre for Research in Experimental Space Science, York University, 4700 Keele St., North York, Ontario, Canada, M3J 1P3

Extract

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We have developed several detector systems for use in observational astronomy. These include a rapid scanning spectrometer (Jeffers and Weller, 1973), a rapid chopping spectrophotometer (Stiff and Jeffers, 1978) and an intensified, silicon vidicon detector for use either for spectrophotometry (Jeffers, Stiff and Weller, 1983) or direct imaging (Jeffers, 1982). These detector systems have been used for rapid variability studies of emission line strengths and profiles in Wolf-Rayet and Of stars (Weller and Jeffers, 1979; Jeffers, Stiff and Weller, 1985) and for low dispersion spectrophotometry of these stars (Jeffers and Weller, 1985). Here we report on the spectrophotometric performance of the intensified, silicon vidicon detector (RCA 4804H) when used with a low dispersion spectrograph.

Type
III. Spectroscopic Research Programmes
Information
Symposium - International Astronomical Union , Volume 118: Instrumentation and Research Programmes for Small Telescopes , 1986 , pp. 453 - 455
Copyright
Copyright © Reidel 1986 

References

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