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Novel Setup for High Performance Simultaneous 3D EBSD and 3D EDS Acquisition

Published online by Cambridge University Press:  04 August 2017

Rostislav Váňa ,
Jiří Dluhoš ,
Lukáš Hladík ,
John Lindsay  and
Jenny Goulden
Rostislav Váňa
Affiliation:
TESCAN Brno, s.r.o, R&D Applications, Brno, Czech Republic
Jiří Dluhoš
Affiliation:
TESCAN Brno, s.r.o, R&D Applications, Brno, Czech Republic
Lukáš Hladík
Affiliation:
TESCAN Brno, s.r.o, R&D Applications, Brno, Czech Republic
John Lindsay
Affiliation:
Oxford Instruments, Nanoanalysis, High Wycombe, United Kingdom
Jenny Goulden
Affiliation:
Oxford Instruments, Nanoanalysis, High Wycombe, United Kingdom

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 282 - 283
Copyright
© Microscopy Society of America 2017 

References

[1] Zaefferer, S. Book of abstracts EMAS Workshop (p. 123–136, 2009.Google Scholar
[2] Hrnčíř, T., et al, Microsc. Microanal. 19(Suppl 2p. 860–862, 2013.Google Scholar
[3] Hrnčí, T. & Hladík, L. Proceedings from the 39th International Symposium for Testing and Failure Analysis, (2013), p. 27.Google Scholar
[4] Patent CZ 301692, (2009).Google Scholar