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Liquid Cell TEM of Al Thin Film Corrosion under Potentiostatic Polarization

Published online by Cambridge University Press:  23 September 2015

See Wee Chee
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA. Center of BioImaging Sciences, Department of Biological Sciences, National University of Singapore, Singapore 117557.
Jeung-Hun Park
Affiliation:
Department of Materials Science and Engineering, University of California Los Angeles, Los Angeles, CA 90095, USA.
Ainsley Pinkowitz
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.
Brent Engler
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.
Frances M. Ross
Affiliation:
IBM TJ Watson Research Center, Yorktown Heights, NY 10598, USA
David Duquette
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.
Robert Hull
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Frankel, G.S. & Rohwerder, M. in “Encyclopedia of Electrochemistry” Volume 4, Corrosion and Oxide Films, M. Stratmann & G.S. Frankel Wiley-VCH, Weinheim, p. 687.Google Scholar
[2] Chee, S.W., et al., Microsc. Microanal. 20 (2014). p. 462, Chem. Comm. 51 (2015). p. 168.Google Scholar
[3] Wang, C.M., J. Mater. Res. 30 (2015). p. 326.CrossRefGoogle Scholar
[4] The authors acknowledge funding from the National Science Foundation, grant number DMR-1309509..Google Scholar