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Nanoscale magnetometry with NV centers in diamond

Published online by Cambridge University Press:  06 February 2013

Sungkun Hong ,
Michael S. Grinolds ,
Linh M. Pham ,
David Le Sage ,
Lan Luan ,
Ronald L. Walsworth  and
Amir Yacoby
Sungkun Hong
Affiliation:
School of Engineering and Applied Sciences, Harvard University; shong@seas.harvard.edu
Michael S. Grinolds
Affiliation:
Department of Physics, Harvard University; grinolds@fas.harvard.edu
Linh M. Pham
Affiliation:
School of Engineering and Applied Sciences, Harvard University; mylinh@seas.harvard.edu
David Le Sage
Affiliation:
Harvard-Smithsonian Center for Astrophysics; dlesage@cfa.harvard.edu
Lan Luan
Affiliation:
Harvard University; lluan@physics.harvard.edu
Ronald L. Walsworth
Affiliation:
Department of Physics, Harvard University; rwalsworth@cfa.harvard.edu
Amir Yacoby
Affiliation:
Harvard University; yacoby@physics.harvard.edu
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Abstract

Nitrogen-vacancy (NV) color centers in diamond are currently considered excellent solid-state magnetic field sensors. Their long coherence times at room temperature and their atomic size allow for achieving both high magnetic field sensitivity and nanoscale spatial resolution in ambient conditions. This article reviews recent progress in magnetic field imaging with NV centers. We focus on two topics: scanning probe techniques with single NV centers and their application in the imaging of nanoscale magnetic structures, as well as recent development of magnetometers with ensembles of NV centers, which image magnetic fields at micron-length scales with extremely high sensitivities.

Keywords

Diamondsensormagneticnanoscaleelectron spin resonance
Type
Research Article
Information
MRS Bulletin , Volume 38 , Issue 2: Nitrogen-vacancy centers: Physics and applications , February 2013 , pp. 155 - 161
Copyright
Copyright © Materials Research Society 2013 

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References

Rabi, I.I., Zacharias, J.R., Millman, S., Kusch, P., Phys. Rev. 53, 318 (1938).CrossRefGoogle Scholar
Bloch, F., Phys. Rev. 70, 460 (1946).CrossRefGoogle Scholar
Mansfield, P., Angew. Chem. Int. Ed. 43, 5456 (2004).Google Scholar
Martin, Y., Wickramasinghe, H.K., Appl. Phys. Lett. 50, 1455 (1987).Google Scholar
Chang, A.M., Hallen, H.D., Harriott, L., Hess, H.F., Kao, H.L., Kwo, J., Miller, R.E., Wolfe, R., van der Ziel, J., Chang, T.Y., Appl. Phys. Lett. 61, 1974 (1992).CrossRefGoogle Scholar
Kirtley, J.R., Ketchen, M.B., Stawiasz, K.G., Sun, J.Z., Gallagher, W.J., Blanton, S.H., Wind, S.J., Appl. Phys. Lett. 66, 1138 (1995).Google Scholar
Zuger, O., Rugar, D., Appl. Phys. Lett. 63, 2496 (1993).CrossRefGoogle Scholar
Taylor, J.M., Cappellaro, P., Childress, L., Jiang, L., Budker, D., Hemmer, P.R., Yacoby, A., Walsworth, R., Lukin, M.D., Nat. Phys. 4, 810 (2008).CrossRefGoogle Scholar
Balasubramanian, G., Chan, I.Y., Kolesov, R., Al-Hmoud, M., Tisler, J., Shin, C., Kim, C., Wojcik, A., Hemmer, P.R., Krueger, A., Hanke, T., Leitenstorfer, A., Bratschitsch, R., Jelezko, F., Wrachtrup, J., Nature 455, 648 (2008).Google Scholar
Maze, J.R., Stanwix, P.L., Hodges, J.S., Hong, S., Taylor, J.M., Cappellaro, P., Jiang, L., Dutt, M.V.G., Togan, E., Zibrov, A.S., Yacoby, A., Walsworth, R.L., Lukin, M.D., Nature 455, 644 (2008).Google Scholar
Degen, C.L., Appl. Phys. Lett. 92, 243111 (2008).Google Scholar
Gruber, A., Drabenstedt, A., Tietz, C., Fleury, L., Wrachtrup, J., Borczyskowski, C.V., Science 276, 2012 (1997).CrossRefGoogle Scholar
Budker, D., Gawlik, W., Kimball, D.F., Rochester, S.M., Yashchuk, V.V., Weis, A., Rev. Mod. Phys. 74, 1153 (2002).CrossRefGoogle Scholar
de Lange, G., Ristè, D., Dobrovitski, V.V., Hanson, R., Phys. Rev. Lett. 106, 080802 (2011).CrossRefGoogle Scholar
Balasubramanian, G., Neumann, P., Twitchen, D., Markham, M., Kolesov, R., Mizuochi, N., Isoya, J., Achard, J., Beck, J., Tissler, J., Jacques, V., Hemmer, P.R., Jelezko, F., Wrachtrup, J., Nat. Mater. 8, 383 (2009).Google Scholar
Shah, V., Knappe, S., Schwindt, P.D.D., Kitching, J., Nat. Photon. 1, 649 (2007).CrossRefGoogle Scholar
Ohno, K., Heremans, F.J., Bassett, L.C., Myers, B.A., Toyli, D.M., Jayich, A.C.B., Palmstrom, C.J., Awschalom, D.D., Appl. Phys. Lett. 101, 082413 (2012).Google Scholar
Rabeau, J.R., Reichart, P., Tamanyan, G., Jamieson, D.N., Prawer, S., Jelezko, F., Gaebel, T., Popa, I., Domhan, M., Wrachtrup, J., Appl. Phys. Lett. 88, 023113 (2006).Google Scholar
Maletinsky, P., Hong, S., Grinolds, M.S., Hausmann, B.J.M., Lukin, M.D., Walsworth, R., Loncar, M., Yacoby, A., Nat. Nano 7, 320 (2012).Google Scholar
Grinolds, M.S., Maletinsky, P., Hong, S., Lukin, M.D., Walsworth, R.L., Yacoby, A., Nat. Phys. 7, 687 (2011).CrossRefGoogle Scholar
Hong, S., Grinolds, M.S., Maletinsky, P., Walsworth, R.L., Lukin, M.D., Yacoby, A., Nano Lett. 12, 3920 (2012).Google Scholar
Maertz, B.J., Wijnheijmer, A.P., Fuchs, G.D., Nowakowski, M.E., Awschalom, D.D., Appl. Phys. Lett. 96, 092504 (2010).Google Scholar
Steinert, S., Dolde, F., Neumann, P., Aird, A., Naydenov, B., Balasubramanian, G., Jelezko, F., Wrachtrup, J., Rev. Sci. Instrum. 81, 043705 (2010).Google Scholar
Pham, L.M., Sage, D.L., Stanwix, P.L., Yeung, T.K., Glenn, D., Trifonov, A., Cappellaro, P., Hemmer, P.R., Lukin, M.D., Park, H., Yacoby, A., Walsworth, R.L., New J. Phys. 13, 045021 (2011).CrossRefGoogle Scholar
Gullion, T., Baker, D.B., Conradi, M.S., J. Magn. Reson. 89, 479 (1990).Google Scholar
Pham, L.M., Bar-Gill, N., Belthangady, C., Le Sage, D., Cappellaro, P., Lukin, M.D., Yacoby, A., Walsworth, R.L., in press (available at http://arxiv.org/abs/1201.5686).Google Scholar
Le Sage, D., Pham, L.M., Bar-Gill, N., Belthangady, C., Lukin, M.D., Yacoby, A., Walsworth, R.L., Phys. Rev. B 85, 121202 (2012).Google Scholar
Acosta, V.M., Bauch, E., Jarmola, A., Zipp, L.J., Ledbetter, M.P., Budker, D., Appl. Phys. Lett. 97, 174104 (2010).Google Scholar
Pezzagna, S., Naydenov, B., Jelezko, F., Wrachtrup, J., Meijer, J., New J. Phys. 12, 065017 (2010).CrossRefGoogle Scholar
Naydenov, B., Richter, V., Beck, J., Steiner, M., Neumann, P., Balasubramanian, G., Achard, J., Jelezko, F., Wrachtrup, J., Kalish, R., Appl. Phys. Lett. 96, 163108 (2010).CrossRefGoogle Scholar
Schwartz, J., Aloni, S., Ogletree, D.F., Schenkel, T., New J. Phys. 14, 043024 (2012).Google Scholar
Childress, L., Gurudev Dutt, M.V., Taylor, J.M., Zibrov, A.S., Jelezko, F., Wrachtrup, J., Hemmer, P.R., Lukin, M.D., Science 314, 281 (2006).Google Scholar