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Soft X-ray Synchrotron Radiation Investigations of Actinide Materials Systems Utilizing X-ray Emission Spectroscopy and Resonant Inelastic X-ray Scattering

Published online by Cambridge University Press:  01 February 2011

D. K. Shuh ,
S. M. Butorin ,
J.-H. Guo  and
J. Nordgren
D. K. Shuh
Affiliation:
Chemical Sciences Division, Lawrence Berkeley National Laboratory (LBNL), Berkeley, California 94720, USA
S. M. Butorin
Affiliation:
Department of Physics, Uppsala University, Box 530, S-751 21 Uppsala, Sweden
J.-H. Guo
Affiliation:
Advanced Light Source Division, Lawrence Berkeley National Laboratory (LBNL), Berkeley, California 94720, USA
J. Nordgren
Affiliation:
Department of Physics, Uppsala University, Box 530, S-751 21 Uppsala, Sweden
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Abstract

Synchrotron radiation (SR) methods have been utilized with increasing frequency over the past several years to study topics in actinide science, ranging from those of a fundamental nature to those that address a specifically-targeted technical need. In particular, the emergence of microspectroscopic and fluorescence-based techniques have permitted investigations of actinide materials at sources of soft x-ray SR. Spectroscopic techniques with fluorescence-based detection are useful for actinide investigations since they are sensitive to small amounts of material and the information sampling depth may be varied. These characteristics also serve to simplify both sample preparation and safety considerations. Examples of investigations using these fluorescence techniques will be described along with their results, as well as the prospects for future investigations utilizing these methodologies.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 802: Symposium DD – Actinides - Basic Science, Applications, and Technology , 2003 , DD3.10
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Terry, J., Schulze, R. K., Lashley, J., Farr, J. D., Zocco, T., Heinzelman, K., Rotenberg, E., Shuh, D. K., Van der Laan, G., and Tobin, J. G., Surf. Sci. 499, 141 (2002).Google Scholar
2. Tobin, J. G., Chung, B. W., Wadddill, G. D., Schulze, R. K., Terry, J., Farr, J. D., Zocco, T., Shuh, D. K., Heinzelman, K., Rotenberg, E., Van der Laan, G., Phys. Rev. B 155109 (2003).Google Scholar
3. Arko, A. J., Joyce, J. J., Morales, L., Wills, J., Lashley, J., Wastin, F., and Rebizant, J., Phys. Rev. B 62, 1773 (2000).Google Scholar
4. Butorin, S. M., J. Electr. Spectros. Rltd. Phenomena 110–111, 213 (2000).Google Scholar
5. Smith, K. E., McGuiness, C., Downes, J., Duda, L., Ryna, P., Stagarescu, C., Guo, J., Nordgren, J., and Hulbert, S. D., Synchrotron Rad. News 15, 11 (2002).Google Scholar
6. Soft X-ray Science in the Next Millenium: The Future of Photon-In/Photon-Out Experiments: An Assessment of the Scientific and Technological Opportunities and the Instrumentation and Synchrotron Radiation Facility Needs at the Beginning of the New Millenium, Fall Creek Falls State Park, Pikeville, TN, (March, 2000).Google Scholar
7. Butorin, S. M., Mancini, D. C., Guo, J. H.-, Wassdahl, N., Nordgren, J., Nakazawa, M., Tanaka, S., Uozumi, T., Kotani, A., Ma, Y., Miyano, K., Southworth, S. H., Karlin, B. A., and Shuh, D. K., Phys. Rev. Lett. 77, 574 (1996).Google Scholar
8. Kalkowski, G., Kaindl, G., Brewer, W. D., and Krone, W., Phys. Rev. B 35, 2667 (1987).Google Scholar
9. Warwick, T., Heimann, P., Mossessian, D., McKinney, W., and Padmore, H., Rev. Sci. Instrum. 66, 2037 (1995);Google Scholar
Nordgren, J., Bray, G., Cramm, S., Nyholm, R., Rubensson, J.-E., and Wassdahl, N., Rev. Sci. Instrum. 60, 1690 (1989).Google Scholar
10. Jia, J. J., Callcott, T. A., Yurkas, J., Ellis, A. W., Himpsel, F. J., Samant, M. G., Stöhr, J., Ederer, D., Carlisle, J. A., Hudson, E. A., Terminello, L. J., Shuh, D. K., and Perera, R. C. C., Rev. Sci. Instrum. 66, 1394 (1995).Google Scholar
11. Shuh, D. K., Edelstein, N. M., and Bucher, J. J., Safety Procedures for Electron Spectroscopy of Actinides at the ALS, LBNL–39909, (1997).Google Scholar
12. Butorin, S. M., Shuh, D. K., Kvashnina, K., Soroka, I., Ollila, K., Guo, J.-H., Roberts, K. E., Werme, L., and Nordgren, J., Mater. Res. Soc. Symp. Proc., Kalmar, Sweden, in press (2003).Google Scholar
13. Lupinetti, A., Abney, K., Shuh, D. K., Butorin, S. M., Guo, J.-H., Denlinger, J. D., Gilles, M. K., and Tyliszczak, T., (to be published).Google Scholar
14. McGuiness, C., Smith, K. E., Butorin, S. M., Guo, J. H., Nordgren, J., Vogt, T., Schneider, G., Reilly, J., Tu, J. J., Johnson, P. D., and Shuh, D. K., Europhysics Lett. 56, 112 (2001).Google Scholar
15. Butorin, S. M., Albinsson, Y., Shuh, D. K., Guo, J.-H., Werme, L., and Nordgren, J., (to be published).Google Scholar