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Studying Shocked Material Dynamics with Ultrafast X-rays

Published online by Cambridge University Press:  23 September 2015

R.L. Sandberg
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
C. Bolme
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
K. Ramos
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
Q. McCulloch
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
R. Martinez
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
V. Hamilton
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
T. Pierce
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
M. Greenfield
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
S. McGrane
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
J.L. Barber
Affiliation:
Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 □
B. Abbey
Affiliation:
Department of Physics, University of La Trobe, Rm 419, PS1, Melbourne, Victoria, Australia
A. Schropp
Affiliation:
Institute of Structural Physics, Technische Universitat Dresden, D-01062 Dresden, Germany
F. Seiboth
Affiliation:
Institute of Structural Physics, Technische Universitat Dresden, D-01062 Dresden, Germany
P. Heiman
Affiliation:
SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA Author e-mail address: sandberg@lanl.gov
B. Nagler
Affiliation:
SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA Author e-mail address: sandberg@lanl.gov
E. Galtier
Affiliation:
SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA Author e-mail address: sandberg@lanl.gov
E. Granados
Affiliation:
SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA Author e-mail address: sandberg@lanl.gov

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Seiboth, F., et al., J. Phys. Conf Ser vol. 499(no. 1), 012004, Apr. 2014.CrossRefGoogle Scholar
[2] Schropp, A., et al., Sci. Rep. vol. 3, Apr. 2013.Google Scholar
[3] Schropp, A., et al., SPIE Optical Engineering + Applications (2013) 88490R.Google Scholar