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Multimodal Low-Dimensional Materials Characterization with Correlative Microscopy: Raman-PL-FLIM-AFM-SNOM-SEM

Published online by Cambridge University Press:  25 July 2016

Ute Schmidt ,
Wei Liu ,
David Steinmetz ,
Thomas Dieing  and
Olaf Hollricher
Ute Schmidt
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)
Wei Liu
Affiliation:
WITec Instruments, Knoxville, TN, USA
David Steinmetz
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)
Thomas Dieing
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)
Olaf Hollricher
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 224 - 225
Copyright
© Microscopy Society of America 2016 

References

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[2] Koppens, F. H. L., Nueller, T., Avouris, P., Ferrari, A.C., Vitiello, M. S. & Polini, M. M. Nat. Nano 9 (2014). p. 780.CrossRefGoogle Scholar
[3] You, Y., Ni, Z., Yu, T & Shen, Z. Appl. Phys. Letters 39 (2008). p. 13112.Google Scholar