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Epitaxial growth of C60 thin films on mica

Published online by Cambridge University Press:  31 January 2011

W. Krakow ,
N.M. Rivera ,
R.A. Roy ,
R.S. Ruoff  and
J.J. Cuomo
W. Krakow
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
N.M. Rivera
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
R.A. Roy
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
R.S. Ruoff
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
J.J. Cuomo
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
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Abstract

Single crystal films of C60 of different thickness values have been deposited on mica substrates by resistance evaporation. Electron diffraction and high resolution microscopy have been used to assess the orientational ordering and the nature of the defects present in these face-centered cubic films which exhibit a 〈111〉 direction normal to the film surface.

Type
Communications
Information
Journal of Materials Research , Volume 7 , Issue 4 , April 1992 , pp. 784 - 787
Copyright
Copyright © Materials Research Society 1992

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