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Aberration Corrected STEM-EELS: Applications to Magnetic Materials

Published online by Cambridge University Press:  08 April 2017

M Varela ,
J Gazquez ,
F Bruno ,
J Garcia-Barriocanal ,
M Torija ,
M Sharma ,
M Oxley ,
M Prange ,
S Pantelides  and
C Leighton
...Show all authors
M Varela
Affiliation:
Oak Ridge National Laboratory
J Gazquez
Affiliation:
University Complutense
F Bruno
Affiliation:
University Complutense
J Garcia-Barriocanal
Affiliation:
University Complutense
M Torija
Affiliation:
University of Minnesota
M Sharma
Affiliation:
University of Minnesota
M Oxley
Affiliation:
Oak Ridge National Laboratory
M Prange
Affiliation:
Oak Ridge National Laboratory
S Pantelides
Affiliation:
Oak Ridge National Laboratory
C Leighton
Affiliation:
University of Minnesota
C Leon
Affiliation:
University Complutense
J Santamaria
Affiliation:
University Complutense
S Pennycook
Affiliation:
Oak Ridge National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 796 - 797
Copyright
Copyright © Microscopy Society of America 2011