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Structural and dielectric properties of Ca1-x MgxCu3Ti4O12 thin films

Published online by Cambridge University Press:  01 February 2011

L. A. Bermúdez ,
R. P. Guzman ,
M.S. Tomar  and
R.E. Melgarejo
L. A. Bermúdez
Affiliation:
Physics Department, University of Puerto Rico, Mayagüez, PR 00681–9016
R. P. Guzman
Affiliation:
Physics Department, University of Puerto Rico, Mayagüez, PR 00681–9016
M.S. Tomar
Affiliation:
Physics Department, University of Puerto Rico, Mayagüez, PR 00681–9016
R.E. Melgarejo
Affiliation:
Physics Department, University of Puerto Rico, Mayagüez, PR 00681–9016
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Abstract

Ca1-xMgxCu3Ti4O12 material has been synthesized by chemical route for different compositions and thin films have been deposited by spin coating. X-ray diffraction and Raman spectroscopy were used for detailed characterization of this material for both powder and thin films. X-ray diffraction shows single phase film material for different compositions x < 0.80. The initial measurements on dielectric response indicates high dielectric constant > 10, 000 for the composition x = 0.1.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 785: Symposium D – Materials and Devices for Smart Systems , 2003 , D6.7
Copyright
Copyright © Materials Research Society 2004

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References

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