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Surface Sensitive Spectroscopy Study of Ion Beam Irradiation Induced Structural Modifications in Borosilicate Glasses

Published online by Cambridge University Press:  18 March 2013

Amy S. Gandy
Affiliation:
Immobilisation Science Laboratory, Department of Materials Science and Engineering, The University of Sheffield, Mappin Street, Sheffield S1 3JD, UK
Martin C. Stennett
Affiliation:
Immobilisation Science Laboratory, Department of Materials Science and Engineering, The University of Sheffield, Mappin Street, Sheffield S1 3JD, UK
Neil C. Hyatt
Affiliation:
Immobilisation Science Laboratory, Department of Materials Science and Engineering, The University of Sheffield, Mappin Street, Sheffield S1 3JD, UK
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Abstract

Fe K edge X-ray absorption (XAS) and Fourier Transform Infra-Red (FT-IR) spectroscopies have been used to study potential structural modifications in sodium borosilicate glasses as a consequence of Kr+ irradiation. Glasses were doped with simulant waste elements and irradiated at room temperature with 450 keV Kr+ ions to a fluence of 2x1015 Kr+ ions cm-1. According to SRIM calculations, a damaged surface region approximately 400nm wide was produced. In order to probe only the damaged surface layer, XAS measurements were taken in total electron yield mode and FT-IR spectroscopy was conducted in reflectance off the glass surface. No change in Fe valence state was detected by XAS following irradiation. Reflectance FT-IR data revealed a shift to higher wavenumbers in the absorption bands located between 850 and 1100 cm-1 in the doped glasses, corresponding to bond stretching in the silicate network. Deconvolution of FT-IR spectra revealed the shift was due to polymerisation of the silicate network. Network connectivity was found to decrease in the un-doped glass, following irradiation. The results suggest an increase in silicate network connectivity by a cation mediated process, and demonstrates the successful application of surface sensitive XAS and FT-IR to the investigation of ion beam induced damage in amorphous materials.

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Articles
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Weber, W. J., Ewing, R. C., Catlow, C. R. A., Diaz de la Rubia, T., Hobbs, L. W., Kinoshita, C., Matzke, Hj., Motta, A. T., Nastasi, M., Salje, E. K. H., Vance, E. R., Zinkle, S. J., J. Mater. Res, 13, 1434 (1998)10.1557/JMR.1998.0205CrossRefGoogle Scholar
Kuramoto, K., Mitamura, H., Banba, T. and Muraoka, S., Progress in Nuclear Energy, 32, 509 (1998)10.1016/S0149-1970(97)00061-9CrossRefGoogle Scholar
Omel’yanenko, B. I., Livshits, T. S., Yudintsev, S. V., and Nikonov, B. S., Geology of Ore Deposits, 49, 173 (2007)10.1134/S1075701507030014CrossRefGoogle Scholar
Reid, D.P., Stennett, M.C., Ravel, B., Woicik, J.C., Peng, N. Maddrell, E.R., Hyatt, N.C. Nucl. Instr. Meth. Phys. Res. B 268, 1847 (2010)10.1016/j.nimb.2010.02.026CrossRefGoogle Scholar
Farges, F., Rossano, S., Lefrˋere, Y., Wilke, M. and Brown, G. E. Jr, Physica Scripta, T115, 957, (2005)10.1238/Physica.Topical.115a00957CrossRefGoogle Scholar
Darwish, H., Gomaa, M. M., J. of Mater. Sci.: materials in Electronics, 17, 35 (2006)Google Scholar
El-Egili, K., Physica B 325 340 (2003)10.1016/S0921-4526(02)01547-8CrossRefGoogle Scholar
Gaafara, M.S. and Marzouk, S.Y., Physica B 388, 294 (2007)10.1016/j.physb.2006.06.132CrossRefGoogle Scholar
MacDonald, S. A., Schardt, C. R., Masiello, D. J. and Simmons, J. H., Journal of Non-Crystalline Solids, 275, 72 (2000)10.1016/S0022-3093(00)00121-6CrossRefGoogle Scholar
Ziegler, J.F., Biersack, J.P., Littmark, U., The Stopping and Ranges of Ions in Solids, Pergamon Press, New York, 1985. Available from: <http://www.srim.org>.Google Scholar
Ravel, B. and Newville, M., Journal of Synchrotron Radiation, 12, 537 (2005)10.1107/S0909049505012719CrossRefGoogle Scholar
Mastalerz, M.. “Application of reflectance micro-Fourier Transform infrared (FTIR) analysis to the study of coal macerals” 53rd ICCP Meeting, Copenhagen, August (2001).Google Scholar
Moustafa, Y.M., Hassan, A.K., El-Damrawi, G., and Yevtushenko, N.G., J. of Non-Cryst. Solids, 194, 34 (1996)10.1016/0022-3093(95)00465-3CrossRefGoogle Scholar
El-Batal, F.H., Khalil, E.M., Hamdy, Y.M., Zidan, H.M., Aziz, H.S., Abdelghany, A.M., Silicon, 2, 41 (2010)10.1007/s12633-010-9037-8CrossRefGoogle Scholar
Akatov, A. A., Nikonov, B. S., Omel’yanenko, B. I., Stefanovsky, S. V., and Marra, J. C., Glass Physics and Chemistry, 35, 245 (2009)10.1134/S1087659609030031CrossRefGoogle Scholar