Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-24T01:33:52.152Z Has data issue: false hasContentIssue false

Dislocation Dynamics Simulations of Dislocation Interactions in Thin Fcc Metal Films

Published online by Cambridge University Press:  18 March 2011

Prita Pant
Affiliation:
Materials Science & Engineering Department, Cornell University, Ithaca, NY 14853
K.W. Schwarz
Affiliation:
IBM Research, Yorktown Heights, NY, 10598
S.P. Baker
Affiliation:
Materials Science & Engineering Department, Cornell University, Ithaca, NY 14853
Get access

Abstract

Mesoscopic simulations of dislocation interactions in thin, single crystal FCC metal films were carried out. Interactions between threading-misfit and threading-threading dislocation pairs were studied and the strength of the interactions determined. Threading-threading interactions were found to be significantly stronger than threading-misfit interactions. Dislocations with different possible combinations of Burgers vectors were studied under cyclic loading. Only annihilation of dislocations was seen to result in residual dislocation structure after complete unloading. No differences were observed in the nature of threading-misfit interactions in 111 and 001 oriented films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Nix, W.D., Met. Trans. A, 20A, p. 2217 (1989).Google Scholar
2. Baker, S.P., Keller, R.-M., and Arzt, E., Mat. Res. Soc. Symp. Proc., 505, p. 605 (1998).Google Scholar
3. Weiss, D., PhD Thesis, Universitat Stuttgart, (2000).Google Scholar
4. Freund, L.B., Advances in Applied Mechanics, 30, p. 1 (1994).Google Scholar
5. Baker, S.P., et al., Mat. Res. Soc. Symp. Proc., 516, p. 409 (1998).Google Scholar
6. Freund, L.B., J. Appl. Phys., 68(5), p. 2073 (1990).Google Scholar
7. Nix, W.D., Scripta Mat., 39(4-5), p. 545 (1998).Google Scholar
8. Keller, R.-M., Baker, S.P., and Arzt, E., J. Mater. Res., 13(5), p. 1307 (1998).Google Scholar
9. Shu, J., et al., Mat. Res. Soc. Symp. Proc., 563, p. 207 (1999)Google Scholar
10. Kuschke, W.-M., et al., J.Mater. Res., 13(10), p. 2962 (1998).Google Scholar
11. Baker, S.P., Kretschmann, A., and Arzt, E., to be published in Acta Mater., 2001.Google Scholar
12. Schwarz, K.W., J. Appl. Phys., 85(1), p. 108, (1999).Google Scholar
13. Gillard, V.T., Nix, W.D., and Freund, L.B., J. Appl. Phys., 76(11), p. 7280 (1994).Google Scholar
14. Schwarz, K.W., J. Appl. Phys., 85(2), p. 120 (1999).Google Scholar