Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-24T22:47:51.423Z Has data issue: false hasContentIssue false
  • English
  • Français

Metal Overlayers on Self-Organized Molecular Assemblies: X-ray Photoelectron Spectroscopy of CR/CM and NI/CM on 12-Nercaptododecanenitrile

Published online by Cambridge University Press:  15 February 2011

D. R. Jung  and
A. W. Czanderna
D. R. Jung
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
A. W. Czanderna
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
Get access

Abstract

Overlayers of Cr and Ni deposited at 22 °C and at -100 °C onto self-organized molecular assemblies of HS(CH2 )11 CN on Au have been studied by X-ray photoelectron spectroscopy (XPS). For the lowest overlayer coverages, the C ls and N is core levels show evidence for a chemical interaction between the deposited metal and the CN end-group. At 22 °C and for coverages of 0.6 nm or more, Cr/CN shows a C ls low binding energy, carbide-like shoulder. The degree of metal penetration is assessed based on the attenuation of the C ls and Au 4f intensities, and on the positions of the Cr and Ni 2p levels. In general, the least penetration and the largest binding energy shifts of the C, N, and the Cr or Ni core levels are observed for Cr/CN, while and Ni/CN shows smaller shifts and greater penetration.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 304: Symposium H – Polymer/Inorganic Interfaces , 1993 , 131
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Dubois, L.H. and Nuzzo, R.G., Annu. Rev. Phys. Chem. 43, 437 (1992), and references contained therein.Google Scholar
[2] Bain, C.D., Troughton, E.B., Tao, Y.-T., Evall, J., Whitesides, G.M., Nuzzo, R.G., J. Am. Chem. Soc. 111, 321 (1989).Google Scholar
[3] Tarlov, M.J., Langmuir 8, 80 (1992).CrossRefGoogle Scholar
[4] Czanderna, A.W., King, D.E., and Spaulding, D., J. Vac. Sci. Technol. A 9, 2607 (1991). See also D.E. King, A.W. Czanderna, and D. Spaulding, in Metallized Plastics 3: Fundamental and Applied Aspects, edited by K.L. Mittal (Plenum, New York, 1992), p. 149.Google Scholar
[5] Jung, D.R., King, D.E., and Czanderna, A.W., Proceedings of the Eighth International Conference on Solid Surfaces, Applied Surface Science, In Press, 1993.Google Scholar
[6] Jung, D.R., King, D.E., and Czanderna, A.W., Proceedings of the 39th National Symposium of the American Vacuum Society, J. Vac. Sci. Technol., In Press, 1993.Google Scholar
[7] Allara, D.L., Jung, D.R., and Zhang, P., Abstracts: 39th National Symposium of the American Vacuum Society, Nov. 9–13, 1992, Chicago, IL. Google Scholar
[8] Nuzzo, R.G., Korenic, E.M., and Dubois, L.H., J. Chem. Phys. 93, 767 (1990).CrossRefGoogle Scholar
[9] Hautman, J., and Klein, M.L., J. Chem. Phys. 93, 7483 (1990).CrossRefGoogle Scholar
[10] Godovsky, Y.K., Thermophysical Properties of Polymers, (Springer-Verlag, Berlin, 1992), Chapter 1.CrossRefGoogle Scholar
[11] King, D.E. and Czanderna, A.W., Surf. Sci. Lett. 235, L329 (1990).CrossRefGoogle Scholar
[12] Vig, J.R., J. Vac. Sci. Technol. A 3, 1027 (1985).Google Scholar
[13] Chidsey, C.E.D., Loiacono, D.N., Sleator, T., and Nakahara, S., Surf. Sci. 200, 45 (1988); and Y. Golan, L. Margulis, and I. Rubinstein, Surf Sci. 264, 312 (1992).Google Scholar
[14] Pitts, J.R., Thomas, T.M., and Czanderna, A.W., Appl. Surf. Sci. 26, 107 (1986).Google Scholar
[15] Tanuma, S., Powell, C.J., and Penn, D.R., Surf. Interf. Anal. 17, 911 (1991); and P.E.Laibinis, C.D. Bain, and G.M. Whitesides, J. Phys. Chem. 95, 7017 (1991).CrossRefGoogle Scholar
[16] Steiner, U.B., Caseri, W.R., and Suter, U.W., Langmuir 8, 2771 (1992). See also Ref. 22 of this article.CrossRefGoogle Scholar
[17] Moulder, J.F., Stickle, W.F., Sobol, P.E., and Bomben, K.D., Handbook of X-ray Photoelectron Spectroscopy, edited by Chastain, J.(Perkin Elmer, Eden Prairie, 1992) p. 41.Google Scholar
[18] Wertheim, G.K., DiCenzo, S.B., Buchanan, D.N.E., and Bennett, P.A., Solid State Comm. 53, 377 (1985).Google Scholar
[19] Tu, K.-N., Mayer, J.W., and Feldman, L.C., Electronic Thin Film Science, (Macmillan, New York, 1992), pp. 130–133.Google Scholar