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Infrared behavior of aluminum nanostructure sculptured thin films

Published online by Cambridge University Press:  01 February 2011

Tino Hofmann ,
M. Schubert ,
D. Schmidt  and
E. Schubert
Tino Hofmann
Affiliation:
thofmann@engr.unl.edu, University of Nebraska-Lincoln, Electrical Engineering, 209N WSEC, Lincoln, NE, 68588, United States
M. Schubert
Affiliation:
schubert@engr.unl.edu, University of Nebraska-Lincoln, Department of Electrical Engineering and Nebraska Center for Materials and Nanoscience, Lincoln, NE, 68588, United States
D. Schmidt
Affiliation:
schmidt@bigred.unl.edu, University of Nebraska-Lincoln, Department of Electrical Engineering and Nebraska Center for Materials and Nanoscience, Lincoln, NE, 68588, United States
E. Schubert
Affiliation:
evaschub@engr.unl.edu, University of Nebraska-Lincoln, Department of Electrical Engineering and Nebraska Center for Materials and Nanoscience, Lincoln, NE, 68588, United States
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Abstract

We report on fabrication, structural and infrared optical characterization of nanostructure aluminum sculptured thin films prepared by glancing angle deposition (GLAD) and controlled substrate motion on p-type silicon. We discuss two structures, one with plate-like and one with screw-like (chiral) morphology. While the plate-like sample possesses a metal Drude behavior in the infrared spectral range, the chiral nanowire sample behaves non-metallic and reveals a series of intriguing resonances, which are equally spaced in frequency by ∼7.5 THz. We suggest that formation of 3D nano resonator circuits consisting of inductances and capacitances has occurred within the screw-like conductive aluminum wire sample, which might be responsible for the observed resonances. We suggest conductive GLAD nanostructures in combination with Schottky diodes to facilitate active or passive THz detector and transmitter devices.

Keywords

optical propertiesnanostructureAl
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1080: Symposium O – Semiconductor Nanowires–Growth, Physics, Devices and Applications , 2008 , 1080-O04-16
Copyright
Copyright © Materials Research Society 2008

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References

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