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Accurate Diffraction Peak Identification for Scanning Electron Nanodiffraction Based on Automated Image Processing and Feature Detection

Published online by Cambridge University Press:  04 August 2017

Renliang Yuan ,
Yifei Meng ,
Jiong Zhang  and
Jian-Min Zuo
Renliang Yuan
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA
Yifei Meng
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA
Jiong Zhang
Affiliation:
Intel Corp., Hillsboro, Oregon, USA
Jian-Min Zuo
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 180 - 181
Copyright
© Microscopy Society of America 2017 

Footnotes

*

First two authors contributed equally to this work.

References

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