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A Comprehensive Approach to HEMT Reliability Testing

Published online by Cambridge University Press:  31 January 2011

David Cheney ,
Brent Gila ,
Erica Ann Douglas ,
Fan Ren  and
S. Pearton
David Cheney
Affiliation:
afn07120@afn.org, University of Florida, Electrical & Computing Engineering, Gainesville, Florida, United States
Brent Gila
Affiliation:
bgila@mse.ufl.edu, University of Florida, Materials Science and Engineering, Gainesville, Florida, United States
Erica Ann Douglas
Affiliation:
rede0001@ufl.eduEricaADouglas@gmail.com, University of Florida, Materials Science & Engineering, 100 Rhines Hall, P.O. Box 116400, Gainesville, Florida, 32611, United States
Fan Ren
Affiliation:
fren@ufl.edu, University of Florida, Chemical Engineering, Gainesville, Florida, United States
S. Pearton
Affiliation:
spear@mse.ufl.edu, Univ.Florida, Materials, PO Box 116400, Gainesville, Florida, 32611, United States
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Abstract

Reliability testing often manifests device weaknesses and failure mechanisms. As new materials and structures are developed, creative and different testing is often necessary to determine reliability. We are developing an in-house reliability test system that will provide the necessary testing flexibility of HEMT devices so researchers can pinpoint defects and vulnerabilities. Using commercial off-the-shelf (COTS) power supplies and data acquisition equipment, a custom control system allows for many different tests: DC and RF, temperature, step/stress/recovery, high-speed pulse, and optical pumping, as well as combinations and automated sequencing of these tests. This flexibility allows for the creation of new test types as failure mechanisms are understood. The initial station will provide for the simultaneous, independent testing of 16 devices. This paper outlines the system design and capabilities, the motivation for the system, and some results from different tests.

Keywords

defectsdevicesthermal stresses
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1195: Symposium B – Rellliability and Materials Issues of Semiconductor Optical and Electrical Devices and Materials , 2009 , 1195-B05-03
Copyright
Copyright © Materials Research Society 2010

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References

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