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Imaging And Spectroscopy Of Nanostructures Through Aberration-Corrected Stem

Published online by Cambridge University Press:  01 February 2011

S. J. Pennycook ,
M. F. Chisholm ,
A. R. Lupini ,
A. Borisevich ,
K. Sohlberg ,
J. R. Mcbride ,
S. J. Rosenthal ,
D. Kumar ,
A. Franceschetti  and
S. Rashkeev
...Show all authors
S. J. Pennycook
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN
M. F. Chisholm
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
A. R. Lupini
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
A. Borisevich
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
K. Sohlberg
Affiliation:
Department of Chemistry, Drexel University, Philadelphia, PA
J. R. Mcbride
Affiliation:
Department of Chemistry, Vanderbilt University, Nashville, TN
S. J. Rosenthal
Affiliation:
Department of Chemistry, Vanderbilt University, Nashville, TN
D. Kumar
Affiliation:
North Carolina A&T State University, Greensboro, NC
A. Franceschetti
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN
S. Rashkeev
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN
S. Wang
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN
S. T. Pantelides
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN
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Summary

The aberration-corrected STEM allows nanostructures to be investigated with greater resolution and sensitivity than ever before. Single atom sensitivity is achieved both in imaging and also for spectroscopy, for atoms on surfaces or within the bulk. Nanocrystal size, shape, surface termination, 3D structure and the presence of any defects can be seen with unprecedented ease. The improved sensitivity provides improved input for theory, allowing new insights into nanostructure properties and the origin of their unique functionality. Furthermore, the larger aperture available with aberration-corrected STEM improves the depth resolution dramatically. Nanometer depth resolution can be achieved by simply taking a focal series of images, which may then be reconstructed into a 3D rendering of the material in the same manner as with confocal optical microscopy but maintaining sensitivity to individual atoms.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 877: Symposium S – Magnetic Nanoparticles and Nanowires , 2005 , S3.1
Copyright
Copyright © Materials Research Society 2005

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References

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