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Preparation and Characterization of Cobalt Doped ZnO and TiO2

Published online by Cambridge University Press:  01 February 2011

Shaoguang Yang
Affiliation:
Magnetic Innovation Center (MAGIC), Material Characterization and Preparation Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, HONG KONG.
Silas T. Hung
Affiliation:
Magnetic Innovation Center (MAGIC), Material Characterization and Preparation Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, HONG KONG.
Herman H.Y. Sung
Affiliation:
Magnetic Innovation Center (MAGIC), Material Characterization and Preparation Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, HONG KONG.
A.B. Pakhomov
Affiliation:
Magnetic Innovation Center (MAGIC), Material Characterization and Preparation Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, HONG KONG.
C.Y. Wong
Affiliation:
Magnetic Innovation Center (MAGIC), Material Characterization and Preparation Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, HONG KONG.
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Abstract

Synthesis and characterization of transparent Co-doped ZnO and TiO2 diluted magnetic semiconductor (DMS) films are described. The films are prepared by single sputtering deposition. They are ferromagnetic at temperatures as high as 350 K. The films were characterized by X-ray diffraction (XRD), X-ray photoemission spectroscopy (XPS), X-ray fluorescence (XRF). Optical transparency was measured on UV/VIS spectrometer. The Codoped ZnO films had wurtzite structure similar to ZnO with the (002) preferential texture. Neither XRD nor XPS showed any presence of pure Co or CoO in the samples. The Co-doped TiO2 samples were amorphous, and some unoxidized Co was found in the films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

1. Ohtomo, A., Kawasakim, M. Koida, T., et. al., Appl. Phys. Lett. 72, 2466 (1998)Google Scholar
2. Tang, Z.K., Yu, P., Wong, G.K.L., et. al., Solid state communication 103, 459 (1997)Google Scholar
3. Henrich, V.E., Rep. Prog. Phys. 48, 1481 (1985)Google Scholar
4. Tien, P.K., Appl. Opt. 10, 2395 (1971)Google Scholar
5. Rams, J., , Atejeda and Cabrera, J.M., J.Appl.Phys. 82, 994 (1997); H.Kim, et. al., Appl. Phys. Lett. 69, 25 (1996)Google Scholar
6. Ohno, H., Science 281, 951 (1998)Google Scholar
7. Fledering, R., Keim, M., Reuscher, G., Ossau, W., Schmidt, G., Waag, A. and Molenkamp, L.W., Nature 402, 787 (1999)Google Scholar
8. Ohno, Y., Young, D. K., Beschoten, B., Matsukara, F., Ohno, H., and Awschalom, D. D., Nature 402, 790 (1999)Google Scholar
9. Ohno, H., Matsakura, F., Omiya, T. and Akiba, N., J. Appl. Phys. 85, 4277 (1999)Google Scholar
10. Dietl, T., Ohno, H., Matsukura, F., Cibert, J. and Ferrand, D., Science 287, 1019 (2000)Google Scholar
11. Ueda, K., Tabata, H. and Kawai, T., Appl. Phys. Lett. 79, 988 (2001)Google Scholar
12. Matsumoto, Y., Murakami, M., Shono, T., Hasegawa, T., et. al, Science 291, 854 (2001)Google Scholar
13. Park, W. K., Ortega-Hertogs, R. J., and Moodera, J. S., J. Appl. Phys. (2002) to be published, [46-th Annual Conference on Magnetism and Magnetic Materials, Seattle, Nov. 2001].Google Scholar
14. Yang, S.G., Pakhomov, A. B., Hung, S. T., Wong, C. Y., Intermag Europe 2002, Amsterdam, The Netherlands, April 28 - May 2, 2002.Google Scholar
15. Litvinov, V. I. and Dugaev, V. K., Phys. Rev. Lett. 86, 5593 (2001)Google Scholar