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Structural, optical, and electronic characterization of perfluorinated sexithiophene films and mixed films with sexithiophene

Published online by Cambridge University Press:  03 April 2017

Berthold Reisz ,
Simon Weimer ,
Rupak Banerjee ,
Clemens Zeiser ,
Christopher Lorch ,
Giuliano Duva ,
Johannes Dieterle ,
Keiichirou Yonezawa ,
Jin-Peng Yang  and
Nobuo Ueno
...Show all authors
Berthold Reisz*
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
Simon Weimer
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
Rupak Banerjee
Affiliation:
Department of Physics, Indian Institute of Technology Gandhinagar, Gandhinagar 382355, India
Clemens Zeiser
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
Christopher Lorch
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
Giuliano Duva
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
Johannes Dieterle
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
Keiichirou Yonezawa
Affiliation:
Department of Nanomaterial Science, Graduate School of Advanced Integration Science, Chiba University, Chiba 2638522, Japan
Jin-Peng Yang
Affiliation:
Department of Nanomaterial Science, Graduate School of Advanced Integration Science, Chiba University, Chiba 2638522, Japan
Nobuo Ueno
Affiliation:
Department of Nanomaterial Science, Graduate School of Advanced Integration Science, Chiba University, Chiba 2638522, Japan
Satoshi Kera
Affiliation:
Department of Nanomaterial Science, Graduate School of Advanced Integration Science, Chiba University, Chiba 2638522, Japan; and Institute for Molecular Science, Okazaki, Aichi 444-8585, Japan
Alexander Hinderhofer
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
Alexander Gerlach
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
Frank Schreiber
Affiliation:
Institut für Angewandte Physik, Universität Tübingen, Tübingen 72076, Germany
*
a) Address all correspondence to this author. e-mail: berthold.reisz@uni-tuebingen.de
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Abstract

We report on the growth and characterization of molecular mixed thin films of α-sexithiophene (6T), a well-known organic p-type semiconductor with high hole mobility, together with its perfluorinated counterpart, the so far rarely studied tetradecafluoro-α-sexithiophene (PF6T). Pure and blended thin films of these two molecules with different mixing ratios were grown on silicon oxide in ultrahigh vacuum by coevaporation. The effect of perfluorination and mixing on crystal structure, morphology, electronic, and optical properties was examined. The evolution of the PF6T crystal structure was followed in situ in real time by X-ray scattering. We found a new thin film structure different from the reported bulk phase with molecules either standing-up or lying-down depending on the growth temperature. The different morphologies of pure films and blends were investigated with atomic force microscopy. The impact of mixing on the core-levels and on the highest occupied molecular orbitals of 6T and PF6T is discussed.

Keywords

organiccrystal growthelectronic structure
Type
Invited Articles
Information
Journal of Materials Research , Volume 32 , Issue 10: Focus Issue: Microstructural Characterization for Emerging Photovoltaic Materials , 26 May 2017 , pp. 1908 - 1920
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Copyright © Materials Research Society 2017 

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Footnotes

Contributing Editor: Moritz Riede

References

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