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X-Ray Absorption Spectroscopic Studies of Catalytic Materials

Published online by Cambridge University Press:  21 February 2011

G. H. Via ,
J. H. Sinfelt ,
G. Meitzner  and
F. W. Lytle
G. H. Via
Affiliation:
Exxon Research and Engineering Company, Rt. 22 E, Annandale, NJ 08801
J. H. Sinfelt
Affiliation:
Exxon Research and Engineering Company, Rt. 22 E, Annandale, NJ 08801
G. Meitzner
Affiliation:
Exxon Research and Engineering Company, Rt. 22 E, Annandale, NJ 08801
F. W. Lytle
Affiliation:
The Boeing Company, Seattle, WA 98124
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Abstract

X-ray absorption spectra (XAS) contain information in the LIII near-edge region on filling of the absorber d-band, and in the extended fine-structure region on the physical environment of the absorber. We report here an evaluation of the effect on platinum LIII edges of preparation in clusters with a high fraction of Pt atoms at the surface. We also report the effects on platinum and rhenium LIII edges from addition of copper. These effects are surprisingly small.

We have also re-evaluated extended x-ray absorption fine-structure spectra (EXAFS) of platinum and rhenium in alumina-supported platinum-rhenium bimetallic catalysts. A novel feature of this new analysis was the requirement that interatomic distances, coordination numbers, and Debye-Waller type factors maintain certain physically necessary relationships among themselves. This procedure decreased the number of free variables and increased the amount of information returned by the analysis.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988 , 111
Copyright
Copyright © Materials Research Society 1989

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References

[1] Lytle, F. W., Wei, P. S. P., Greegor, R. B., Via, G. H., and Sinfelt, J. H., J. Chem. Phys., 70, 7849(1979).Google Scholar
[2] Horsley, J. A., J. Chem. Phys., 76, 1451(1982).Google Scholar
[3] Lytle, F. W., Greegor, R. B., Biebesheimer, V. A., Meitzner, G., Horsley, J. A., Via, G. H., and Sinfelt, J. H., Murphree Award Symposium, 191st ACS National Meeting, New York, NY, 1986.Google Scholar
[4] Meitzner, G., Via, G. H., Lytle, F. W., and Sinfelt, J. H., J. Chem. Phys., 83, 353(1985).CrossRefGoogle Scholar
[5] Meitzner, G., Via, G. H., Lytle, F. W., and Sinfelt, J. H., J. Chem. Phys., 87, 6354(1987).Google Scholar
[6] Carter, J. L., McVicker, G. B., Weissman, W., Kmak, W. S., and Sinfelt, J. H., Appl. Catal., 3, 327(1982).Google Scholar
[7] Yates, D. J. C. and Sinfelt, J. H., J. Catal., 8, 348(1967).Google Scholar
[8] Sakellson, S., McMilln, M., and Haller, G. L., Paper 70g, American Institute of Chemical Engineers, 1984 Annual Meeting, San Francisco (1984).Google Scholar
[9] Zschech, E., Blau, W., Kleinstuck, K., Hermann, H., Mattern, N. and Kozlov, M. A., J. Non-Cryst. Sol., 86, 336(1986).Google Scholar
[10] McKale, A. G., Veal, B. W., Paulikas, A. P., Chan, S. -K. and Knapp, G. S., J. Am. Chem. Soc., 110, 3763(1988).Google Scholar
[11] Teo, B.-K. and Lee, P. A., J. Am. Chem. Soc., 101, 2815(1988).Google Scholar