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Study of photogenerated traps in nanopixels by random telegraph signal and low frequency noise

Published online by Cambridge University Press:  31 March 2010

M. Troudi ,
Na. Sghaier ,
A. Kalboussi  and
A. Souifi
M. Troudi*
Affiliation:
Laboratoire de Microélectronique et Instrumentation (UR/03/13-04), Faculté des Sciences de Monastir, Avenue de l'Environnement, 5019 Monastir, Tunisia
Na. Sghaier
Affiliation:
Laboratoire de Microélectronique et Instrumentation (UR/03/13-04), Faculté des Sciences de Monastir, Avenue de l'Environnement, 5019 Monastir, Tunisia Équipe Composants Électroniques (UR/99/13-22), Institut Préparatoire aux Études d'Ingénieurs de Nabeul (IPEIN), 8000 Merazka, Nabeul, Tunisia
A. Kalboussi
Affiliation:
Laboratoire de Microélectronique et Instrumentation (UR/03/13-04), Faculté des Sciences de Monastir, Avenue de l'Environnement, 5019 Monastir, Tunisia
A. Souifi
Affiliation:
Institut des Nanotechnologies de Lyon (site INSA UMR 5270), Institut National des Sciences Appliquées de Lyon (INL), Bât. Blaise Pascal, 7 avenue Jean Capelle, 69621 Villeurbanne Cedex, France
*
manel.troudi@ipein.rnu.tn
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Abstract

In this work, we present noise analysis in a Single Electron Photo-detector (photo-SET or nanopixel) able to detect one by one electron. We perform the power spectral densities (PSD) of random telegraph signals (RTSs) measured in the dark conditions and under light illumination. Photoinduced RTS can be attributed to the charging of a dot near the current path. From these results, photogenerated traps were identified. It is also found that RTS fluctuations depend on the light wavelength.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 50 , Issue 2 , May 2010 , 20302
Copyright
© EDP Sciences, 2010

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