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Correlative and Multiplexed Microscopy for 2-D Chalcogenide Semiconductors

Published online by Cambridge University Press:  25 July 2016

Jeffrey D. Cain ,
Eve D. Hanson  and
Vinayak P. Dravid
Jeffrey D. Cain
Affiliation:
Department of Materials Science and Engineering, and the NUANCE Center, Northwestern University, Evanston, IllinoisUSA
Eve D. Hanson
Affiliation:
Department of Materials Science and Engineering, and the NUANCE Center, Northwestern University, Evanston, IllinoisUSA
Vinayak P. Dravid
Affiliation:
Department of Materials Science and Engineering, and the NUANCE Center, Northwestern University, Evanston, IllinoisUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1554 - 1555
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Novoselov, K.S., et al., Science (2004) 306(5696) p. 666–669.CrossRefGoogle Scholar
[2] Mak, K.F., et al., Phys Rev Lett (2010) 105(13) p. 136805.CrossRefGoogle Scholar
[3] Late, D.J., et al., Advanced Functional Materials (2012) 22(9) p. 1894–1905.CrossRefGoogle Scholar
[4] Huang, Y.-K., et al., ACS Nano (2014) 8(10) p. 10851–10857.Google Scholar
[5] This work is partly supported by NSF-DMR and AFOSR programs.Google Scholar