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Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide

Published online by Cambridge University Press:  27 August 2014

Chad M. Parish ,
Takaaki Koyanagi ,
Sosuke Kondo  and
Yutai Katoh
Chad M. Parish
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Takaaki Koyanagi
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Sosuke Kondo
Affiliation:
Institute of Advanced Energy, Kyoto University, Japan
Yutai Katoh
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1042 - 1043
Copyright
Copyright © Microscopy Society of America 2014 

References

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[7] Research sponsored by Office of Fusion Energy Sciences (YK, CMP) and Nuclear Energy University Partnerships (TK), US Department of Energy. Research supported as part of a user proposal through ORNL’s Center for Nanophase Materials Sciences (CNMS), which is sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy.Google Scholar