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In-situ TEM observation of electromagnetic field in some real materials

Published online by Cambridge University Press:  26 February 2011

Katsuhiro Sasaki ,
Zhouguang Wang ,
Keiichi Fukunaga ,
Tsukasa Hirayama ,
Kotaro Kuroda  and
Hiroyasu Saka
Katsuhiro Sasaki
Affiliation:
khsasaki@hix.nagoya-u.ac.jp, Nagoya University, Quantum Engineering, Furo-cho, Chikusa-Ku, Nagoya, N/A, N/A, Japan, +81-52-789-3350, +81-52-789-3226
Zhouguang Wang
Affiliation:
wangzg@jfcc.or.jp, Japan Fine Ceramics Center, Japan
Keiichi Fukunaga
Affiliation:
fukunaga@jfcc.or.jp, Japan Fine Ceramics Center, Japan
Tsukasa Hirayama
Affiliation:
hirayama@jfcc.or.jp, Japan Fine Ceramics Center, Japan
Kotaro Kuroda
Affiliation:
kuroda@nagoya-u.jp, Nagoya University, Quantum Engineering, Japan
Hiroyasu Saka
Affiliation:
saka@nagoya-u.jp, Nagoya University, Quantum Engineering, Japan
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Abstract

Electromagnetic fields presents in some real materials have been observed using electron holography and a simple method named the Shadow Image Distortion (SID) method which we have developed. The in-situ electron holography observation of the electric field surrounding a ceramic particle showed the rapid degradation of dielectric properties of the particle at an elevated temperature. The cross sectional view of mean electrostatic potential distributions in a silicon device has been observed. In-situ electron holography and SID observations showed the electrostatic potential distribution across a reverse biased p-n junction in a compound semiconductor. The SID method using a dedicated tool allowed single-step imaging of 2D maps of electromagnetic field.

Keywords

transmission electron microscopy (TEM)microstructureelectrical properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 907: Symposium MM – In-Situ Electron Microscopy of Materials , 2005 , 0907-MM04-02
Copyright
Copyright © Materials Research Society 2006

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