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DLC-coated Substrate for Infrared Absorption Spectroscopy in Supercritical Water

Published online by Cambridge University Press:  04 February 2011

Takuji Ube  and
Takashi Ishiguro
Takuji Ube
Affiliation:
Department of Materials Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan
Takashi Ishiguro
Affiliation:
Department of Materials Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan
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Abstract

The stability of several kinds of substrates, such as Corning #1737 glass, fused silica, synthetic silica, water free synthetic silica, zinc selenide, silicon, and diamond like carbon (DLC) coated Si in supercritical water (663K and 25MPa) were examined. Their reaction with the water was evaluated by using Fourier transform infrared (FT-IR) spectroscopy. As a result of the present experiment, it was found that DLC-coated Si is one of the most stable and useful substrates for IR spectroscopy in supercritical water.

Keywords

waterthin filmhydrothermal
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1309: Symposium EE – Solid-State Chemistry of Inorganic Materials VIII , 2011 , mrsf10-1309-ee06-16
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Ishiguro, T., Hori, T. and Qiu, Z., J. Appl. Phys., 106, 023524 (2009).10.1063/1.3181057Google Scholar
2. Nagasawa, Y., Ishida, H., Soeda, F., Ishitani, A., Yoshii, I. and Yamamoto, K., Mikrochim. Acta [Wien] I, 431. (1988).Google Scholar
3. Wood, D. L., Raminovich, E. M., Johnson, D. W. Jr., MacChensney, J. B., J. Am. Ceram. Soc., 66, 693 (1983).Google Scholar
4. Nakayama, M., Ueda, K., Shibahara, M., , Maruyama, K., and Kamata, K., Jpn. J. Appl. Phys. 30 L924. (1991).10.1143/JJAP.30.L924Google Scholar
5. Klein, C. A., Hartnett, T. M., and Robinson, C. J., Phys. Rev. B 45, 12854 (1992).Google Scholar
6. Mutschke, H., Andersen, A. C., Clement, D., Henning, T., and Peiter, G., Astron.Astrophys. 345, 187 (1999).Google Scholar
7. Surdutovich, G. I., Kokenda, J., Fragalli, J.F., Misoguti, L., Vitlina, R., and Baranauskas, V., Thin Solid Films, 279, 119 (1996).Google Scholar