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Optical properties of amorphous ZnO thin film prepared from boiled Zn thin film in ultra high pure water

Published online by Cambridge University Press:  06 June 2012

S. Shanmugan*
Affiliation:
Nano-Optoelectronics Research Laboratory, School of Physics, Universiti Sains Malaysia, 11800 Penang, Malaysia
D. Mutharasu
Affiliation:
Nano-Optoelectronics Research Laboratory, School of Physics, Universiti Sains Malaysia, 11800 Penang, Malaysia
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Abstract

Amorphous zinc oxide (a-ZnO) thin films were synthesized from RF sputtered Zn thin films. The conversion was performed by processing Zn thin film in ultra high pure water at 95°C in various process times (120–180 min). X-ray spectra revealed the presence of amorphous ZnO in the processed films. The calculated band gap was laid in between 3.25 and 3.2 eV. Non-linear behavior in I-V characteristics was observed for all films. The structural defects of a-ZnO were confirmed with PL and Raman studies. The synthesized films at 180 min were more oxygen deficient.

Type
Research Article
Copyright
© EDP Sciences, 2012

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References

Tadatsugu, M., Semicond. Sci. Technol. 20, S35 (2005)
Harbeke, G. (ed.), Polycrystalline Semiconductors: Physical Properties and Applications (Springer Verlag, Berlin, 1985)CrossRefGoogle Scholar
Hartnagel, H.L., Dawar, A.L., Jain, A.K., Jagadish, C., Semiconducting Transparent Thin Films (Institute of Physics Publishing, Bristol, Philadelphia, 1995)Google Scholar
Chopra, K.L., Das, S.R., Thin Film Solar Cells (Plenum Press, New York, 1983)CrossRefGoogle Scholar
Baranski, P., Klotchkov, V., Potykevich, I., Électronique des Semiconducteurs (Mir, Moscow, 1978)Google Scholar
Tsuda, N., Nasu, K., Fujimori, A., Siratori, K., Electronic Conduction in Oxides (Springer, Berlin, Heidelberg, 2000)CrossRefGoogle Scholar
Kazmerski, L.L. (ed.), Polycrystalline and Amorphous Thin Films and Devices (Academic Press, New York, 1980)Google Scholar
Tsukazaki, A., Ohtomo, A., Onuma, T., Ohtani, M., Makino, T., Sumiya, M., Ohtani, K., Chichibu, S.F., Fuke, S., Segawa, Y., Ohno, H., Koinuma, H., Kawasaki, M., Nat. Mater. 4, 42 (2005)CrossRef
Bagmall, D.M., Chen, Y.F., Zhu, Z., Tao, T., Koyama, A., Shen, M.Y., Goto, T., Appl. Phys. Lett. 70, 2230 (1997)CrossRef
Wenas, W.W., Yamada, A., Konagai, M., Takahashim, K., Jpn J. Appl. Phys. 30, L441 (1991)CrossRef
Sang, B., Yamada, A., Konagai, M., Jpn J. Appl. Phys. 37, L206 (1998)CrossRef
Ryu, Y.R., Zhu, S., Look, D.C., Wrobel, J.M., Jeong, H.M., White, H.W., J. Cryst. Growth 216, 330 (2000)CrossRef
Wang, Y.G., Lau, S.P., Lee, H.W., Yu, S.F., Tay, B.K., Zhang, X.H., Hng, H.H., J. Appl. Phys. 94, 354 (2003)CrossRef
Lv, M., Xiu, X., Pang, Z., Dai, Y., Ye, L., Cheng, C., Han, S., Thin Solid Films 516, 2017 (2008)CrossRef
Bouderbala, M., Hamzaoui, S., Adnane, M., Sahraoui, T., Zerdali, M., Thin Solid Films 517, 1572 (2009)CrossRef
Izaki, M., Omi, T., Appl. Phys. Lett. 68, 2439 (1996)CrossRef
Caglar, M., Ilican, S., Caglar, Y., Yakuphanoglu, F., Appl. Surf. Sci. 255, 4491 (2009)CrossRef
Lin, K., Tsai, P., Thin Solid Films 515, 8601 (2007)CrossRef
Zhang, J., Yang, Y., Xu, B., Jiang, F., Li, J., J. Cryst. Growth 280, 509 (2005)CrossRef
Sekar, A., Kim, S.H., Umar, A., Hahn, Y.B., J. Cryst. Growth 277, 471 (2005)CrossRef
Qiu, Z., Nadamura, Y., Ishiguro, T., Thin Solid Films 518, 5912 (2010)CrossRef
Eo, I.S., Hwangbo, S., Kim, J.T., Hwang, K.S., Curr. Appl. Phys. 10, 1 (2010)CrossRef
Hwangbo, S., Lee, Y.J., Hwang, K.S., Ceram. Int. 34, 1237 (2008)CrossRef
Swanepoel, R., J. Phys. E: Sci. Instr. 16, 1214 (1983)CrossRef
Manifacier, J.C., Gasiot, J., Fillard, J.P., J. Phys. E: Sci. Instr. 9, 1002 (1976)CrossRef
Rusu, G.G., Rusu, M., Girtan, M., Vacuum 81, 1476 (2007)CrossRef
Shimono, D., Tanaka, S., Torikai, T., Watari, T., Murano, M., J. Ceram. Process. Res. 2, 184 (2001)
Yuvaraj, D., Narasimha Rao, K., Vacuum 82, 1274 (2008)CrossRef
http://www.ukm.my/cfdee/images/j2008_electrical_characterization_cross-inked_zno_nss.pdf
Ilican, S., Caglar, Y., Caglar, M., J. Optoelectron. Adv. Mat. 10, 2578 (2008)
http://carbon.imr.ac.cn/China-Korea/Presentation/_Gyu%20Tae%20Kim.pdf
Frenkel, J., Phys. Rev. 54, 647 (1938)CrossRef
Teke, A., Ozgur, U., Dogan, S., Gu, X., Morkoç, H., Nemeth, B., Nause, J., Everitt, H.O., Phys. Rev. B 70, 195207 (2004)CrossRef
Wei, X., Man, B., Xue, C., Chen, C., Liu, M., Jpn J. Appl. Phys. 45, 8586 (2006)CrossRef
Mari, B., Manjon, F.J., Mollar, M., Cembrero, J., Gomez, R., Appl. Sur. Sci. 252, 2826 (2006)CrossRef
Wang, Q.P., Zhang, D.H., Xue, Z.Y., Zhang, X.J., Opt. Materials 26, 23 (2004)CrossRef
Gong, Y., Andelman, T., Neumark, G.F., O’Brien, S., Kuskovsky, I.L., Nano. Res. Lett. 2, 297 (2007)CrossRef
Vanheusden, K., Warren, W.L., Seager, C.H., Tallant, D.R., Voigt, J.A., Gnade, B.E., J. Appl. Phys. 79, 7983 (1996)CrossRef
Liu, X., Wu, X., Cao, H., Chang, R.P.H., J. Appl. Phys. 95, 3141 (2004)CrossRef
Studenikin, S.A., Golego, N., Cocivera, M., J. Appl. Phys. 84, 2287 (1998)CrossRef
Wu, X.L., Siu, G.G., Fu, C.L., Ong, H.C., Appl. Phys. Lett. 78, 2285 (2001)CrossRef
Egelhaaf, H-J., Oelkrug, D., J. Cryst. Growth 161, 190 (1996)CrossRef
Ellmer, K., Klein, A., Rech, B., Transparent Conductive Zinc Oxide: Basics and Applications in Thin Film Solar Cells (Springer, New York, 2008), Chap. 1, p. 21CrossRefGoogle Scholar
Torres-Torres, C., García-Cruz, M.L., Castañeda, L., Rangel Rojo, R., Tamayo-Rivera, L., Maldonado, A., Avendaño-Alejo, M., Torres-Martínez, R., J. Lumin. 132, 1083 (2012)CrossRef
Kang, H.S., Kang, J.S., Kim, J.W., Lee, S.Y., J. Appl. Phys. 95, 1246 (2004)CrossRef
Xu, X.L., Lau, S.P., Chen, J.S., Chen, G.Y., Tay, B.K., J. Cryst. Growth 223, 201 (2001)CrossRef
Tzolov, M., Tzenov, N., Dimova-Malinovska, D., Kalitzova, M., Pizzutoc, C., Vitalic, G., Zollo, G., Ivanov, I., Thin Solid Films 396, 274 (2001)CrossRef
Yoon, S.H., Growth and characterization of ZnO and PZT films for micromachined acoustic wave devices, Doctorate in Philosophy, 2009Google Scholar
Saron, K.M.A., Hashim, M.R., Farrukh, M.A., Appl. Surf. Sci. 258, 5200 (2012)CrossRef