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Tunneling Spectroscopy of short atomic chains.

Published online by Cambridge University Press:  11 February 2011

Jeremy Stein  and
Fredy R. Zypman
Jeremy Stein
Affiliation:
Yeshiva University, Department of Physics, 2495 Amsterdam Ave., New York, NY, USA
Fredy R. Zypman
Affiliation:
Yeshiva University, Department of Physics, 2495 Amsterdam Ave., New York, NY, USA
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Abstract

In this paper we present results on transmission-energy and current-voltage curves for a Scanning Tunneling Microscopy probe in the presence of an atomic chain, operating in spectroscopy mode. We compare the results with independently calculated density of sates. Finally, we propose algorithms to process this experimental information to obtain chemical specificity and position of impurities in the chain.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 738: Symposium G – Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures , 2002 , G7.7
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

Rubio-Bollinger, G., Bahn, S.R., Agrait, N., Jacobsen, K.W., and Vieira, S., Phys. Rev. Lett. 87, 026101 (2001)Google Scholar
2 Stein, Jeremy, Zypman, Fredy, “Spectroscopy of atomic chains with tunneling microscopy”, to appear in UltramicroscopyGoogle Scholar
3 Tersoff, J., Hamann, D.R., Phys. Rev. B31, 805 (1985)Google Scholar
4 Lang, N.D., Phys. Rev. Lett. 55, 230 (1985)Google Scholar
5 Lang, N.D., Phys. Rev. Let. 55, 2925 (1985)Google Scholar
6 Chen, C. J., J. Vac. Sci. Technol. A6, 319 (1988)Google Scholar
7 Leavens, C.R., Aers, G.C., Phys. Rev. B38, 7357 (1988)Google Scholar
8 Tekman, E., Ciraci, S., Phys. Rev. B40, 10286 (1989)Google Scholar
9 Ciraci, S., Tekman, E., Phys. Rev. B40, 11969 (1989)Google Scholar
10 Chen, C. J., Phys. Rev. Lett. 65, 448 (1990)Google Scholar
11 Doyen, G., Drakova, D., Scheffler, M., Phys. Rev. B47, 9778 (1993)Google Scholar
12 Feenstra, R.M., J. Vac. Sci. Technol. B7, 925 (1989)Google Scholar
13 Avouris, P., Lyo, I., Surf. Sci. 242, 1 (1991)Google Scholar
14 Hamers, R.J., Tromp, R.M., Demuth, J.E., Phys. Rev. Lett. 56, 1972 (1986).Google Scholar
15 Hess, H.F., Robinson, R.B., Dynes, R.C., Valles, J.M. Jr, Waszczak, J.V., J. Vac. Sci. Technol. A8, 450 (1990)Google Scholar
16 Davis, L.C., Everson, M.P., Jaklevic, R.C., Shen, W., Phys. Rev. B43, 3821 (1991)Google Scholar
17 Stroscio, J.A., Feenstra, R.M., Fein, A.P., Phys. Rev. Lett. 57, 2579 (1986)Google Scholar
18 Feenstra, R.M., Stroscio, J.A., Fein, A.P., Surf. Sci. 181, 295 (1987)Google Scholar
19 Lang, N.D., Phys. Rev. B34, 5947 (1986)Google Scholar
20 Selloni, A., Carnevalli, P., Tosati, E., Chen, C.D., Phys. Rev. B31, 2602 (1985)Google Scholar
21 Tsukada, M., Kobayashi, K., Isshiki, N., Kageshima, H., Surf. Sci. Reports 13, 2 (1991)Google Scholar
22 Zypman, F.R., Fonseca, L.F., Goldstein, Y., Phys. Rev. B49, 1981 (1994);Google Scholar
Zypman, F.R., Fonseca, L.F., Phys. Rev. B51, 2501 (1995);Google Scholar
Zypman, Fredy R, Fonseca, Luis, Phys Rev B55, 15012 (1997)Google Scholar
23 Tromp, R., J. Phys. Condens. Matt. 1 10211 (1989)Google Scholar
24 Hamers, R.J. in Scanning Tunneling Microscopy I, edited by Güntherodt, H. J. and Wiesendanger, R., Springer Series in Surface Sciences 20 (1992)Google Scholar
25 Hamers, R.J., Annu. Rev. Phys. Chem. 40, 531 (1989)Google Scholar