Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-24T03:01:10.893Z Has data issue: false hasContentIssue false
  • English
  • Français

When will low-contrast features be visible in a STEM X-ray spectrum image?

Published online by Cambridge University Press:  23 September 2015

Chad M. Parish
Chad M. Parish*
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1425 - 1426
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Zaluzec, N J & Microan, Micros.. V15(Supp. 2 (2009). P. 458.Google Scholar
[2] Talukder, M R et a., Int. J. Mass Spect. V269 (2008). P 118–130. V309 (2012) P. 118.Google Scholar
[3] Williams, DB & Carter, CB," Transmission Electron Microscopy, (2 ed)," Springer, Belin (2009).Google Scholar
[4] Michael, J R, et al., J. Microsc. V160 (1990). P. 41.Google Scholar
[5] Ritchie, N W M & Microan., Mirosc., V15(5) (2009). P 454.Google Scholar
[6] Kotula, P G, et al., Mirosc. Microan V9(1) (2003). P. 1.Google Scholar
[7] Parish, C M & Microan., Mirosc., accepted.Google Scholar
[8] This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. A portion of the Microscopy conducted as part of a user proposal at ORNL's Center for Nanophase Materials Sciences, which is an Office of Science User Facility. I acknowledge the use of the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation.Google Scholar