Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-25T14:47:20.607Z Has data issue: false hasContentIssue false

Development of Nonvolatile Memory using Well-Ordered Ferroelectric Linear Molecules

Published online by Cambridge University Press:  01 February 2011

Kenji Ishida
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Kyotodaigaku Katsura, Nishikyo-ku, Kyoto 616–8510, Japan
Kazunari Katsumoto
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Kyotodaigaku Katsura, Nishikyo-ku, Kyoto 616–8510, Japan
Shuichiro Kuwajima
Affiliation:
Nanotech Support Project, Kyoto University, Kyotodaigaku Katsura, Nishikyo-ku, Kyoto 616–8510, Japan.
Toshihisa Horiuchi
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Kyotodaigaku Katsura, Nishikyo-ku, Kyoto 616–8510, Japan
Hirofumi Yamada
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Kyotodaigaku Katsura, Nishikyo-ku, Kyoto 616–8510, Japan
Kazumi Matsushige
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Kyotodaigaku Katsura, Nishikyo-ku, Kyoto 616–8510, Japan
Get access

Abstract

Ferroelectric vinylidene fluoride (VDF) molecular films were fabricated by simple vacuum evaporation method, and the ferroelectric properties and its fatigue were investigated. Formation of ferroelectric phase in VDF oligomer with low molecular weight is favored at low substrate temperature around -150°C. The well-ordered VDF oligomer thin films exhibit a lager value of remanent polarization(130mC/m2) than that of Poly(VDF). Fatigues of polarization reversal can be performed over 10∧5 cycles. The VDF oligomer films can be one of candidates for disposable nonvolatile memory with unique features such as flexible, wide areas and low cost processing.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kawai, H.: Jpn. J. Appl. Phys. 8, 975 (1969)Google Scholar
2. Bergman, J. G. Jr, McFee, J. H. and Crane, G. R., Appl. Phys. Lett. 18, 203 (1971)Google Scholar
3. Takeno, A., Okui, N., Kitoh, T., Muraoka, M., Umemoto, S. and Sakkai, T., Thin Solid Films 202, 205 (1991)Google Scholar
4. Bachmann, M. A. and Gordon, W. L., J. Appl. Phys. 50, 6106 (1975)Google Scholar
5. Kobayashi, M., Tashiro, K., Tadokoro, H., Macromolecules 8, 158 (1975)Google Scholar
6. Tashiro, K., Abe, Y., Kobayashi, M., Ferroelectrics 171, 281 (1995)Google Scholar
7. Ishida, K., Noda, K., Kubono, A., Horiuchi, T. and Matsushige, K., OME98–27, 17(1998) (in Japanese)Google Scholar
8. Ishida, K., Noda, K., Kubono, A., Horiuchi, T. and Matsushige, K., Material Reseaech Society Proceeding 600, 101 (2000)Google Scholar
9. Noda, K., Ishida, K., Kubono, A., Horiuchi, T. and Matsushige, K., J. Appl. Phys. 86, 3688 (1999)Google Scholar
10. Hsu, C. C. and Geil, P. H., J. Appl. Phys. 56, 2404 (1984)Google Scholar
11. Noda, K., Ishida, K., Kubonoa, A., Horiuchi, T. and Matsushige, K., Material Reseaech Society Proceeding 748, 217 (2003)Google Scholar
12. Noda, K., Ishida, K., Kubonoa, A., Horiuchi, T. and Matsushige, K., J. Appl. Phys. 93, 2866 (2003)Google Scholar