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Comparison Between Cadmium Zinc Telluride Crystals Grown in Russia and in the Ukraine

Published online by Cambridge University Press:  10 February 2011

H. Hermon ,
M. Schieber ,
R. B. James ,
N. Yang ,
A. J. Antolak ,
D. H. Morse ,
N. N. P. Kolesnikov ,
Yu. N. Ivanov ,
V. Komar  and
M. S. Goorsky
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H. Hermon
Affiliation:
Sandia National Laboratories, Livermore, CA
M. Schieber
Affiliation:
Also at The Hebrew University of Jerusalem, Jerusalem, Israel
R. B. James
Affiliation:
Sandia National Laboratories, Livermore, CA
N. Yang
Affiliation:
Sandia National Laboratories, Livermore, CA
A. J. Antolak
Affiliation:
Sandia National Laboratories, Livermore, CA
D. H. Morse
Affiliation:
Sandia National Laboratories, Livermore, CA
N. N. P. Kolesnikov
Affiliation:
Institute of Solid State Physics, Russian Academy of Sciences, Moscow, Russia
Yu. N. Ivanov
Affiliation:
Institute of Solid State Physics, Russian Academy of Sciences, Moscow, Russia
V. Komar
Affiliation:
Institute for Single Crystals, National Academy of Science, Kharkov, Ukraine
M. S. Goorsky
Affiliation:
UCLA, Los Angeles, CA
H. Yoon
Affiliation:
UCLA, Los Angeles, CA
J. Toney
Affiliation:
Carnegie Mellon University, Pittsburgh, PA.
T. E. Schlesinger
Affiliation:
Carnegie Mellon University, Pittsburgh, PA.
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Abstract

A comparative analysis of different Cd1−xZnxTe (CZT) crystals grown by a vertical high pressure Bridgman (VHPB) method is reported. The results of several analytical techniques, such as triple axis x-ray diffraction (TAD), rocking curves, low temperature photoluminescence (PL), scanning electron microscopy (SEM), and proton induced x-ray emission (PIXE) are discussed. Segregated carbon inclusions were identified by SEM and energy dispersive x-ray fluorescence (EDXRF), and the results are interpreted in terms of constitutional supercooling of the solidifying CZT melt. The carbon inclusions significantly decrease the resistivity, and in some cases, the noise is too large for the fabrication of radiation detectors. Combining these results with other measurements reported by our research team [1], we identify correlations between the growth and the defects identified in these CZT crystals.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 13
Copyright
Copyright © Materials Research Society 1998

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References

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