Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-23T09:01:21.127Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct measurement of indentation frame compliance

Published online by Cambridge University Press:  03 March 2011

Krystyn J. Van Vliet ,
Lubos Prchlik  and
James F. Smith
Krystyn J. Van Vliet
Affiliation:
Department of Surgical Research, The Children’s Hospital and Harvard Medical School, Boston, Massachusetts 02115
Lubos Prchlik
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
James F. Smith
Affiliation:
MicroMaterials Limited, Unit 3, Wrexham Technology Park, Wrexham LL13 7YP, United Kingdom
Get access

Abstract

Accurate determination of frame compliance is an essential component of instrumented micro- and nanoindentation experiments. In load frames of finite stiffness, the load applied via the indenter induces displacement in both the sample and the load frame. Frame compliance must be identified and subtracted from the total indenter displacement to account properly for sample deformation. Current experimental procedures, in which the frame compliance is inferred from the elastic unloading indentation response of a reference sample, are based on several assumptions and simplifications that can propagate significant uncertainty with respect to subsequent analyses of mechanical behavior of the sample. We outline a new procedure that measures the compliance of the load frame, and identify the effects of load, loading direction, and loading rate on the measured compliance, as well as several possible sources of uncertainty in other available methods of frame compliance determination.

Keywords

IndentationMechanical propertiesTribology
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 1 , January 2004 , pp. 325 - 331
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Oliver, W.C. and Pharr, G.M., J. Mater. Res. 7 1564 (1992).CrossRefGoogle Scholar
2.Nix, W.D., Elastic and plastic properties of thin films on substrates: Nanoindentation techniques. Mater. Sci. Eng. A 234 37 (1997).Google Scholar
3.Dao, M., Chollacoop, N., Van Vliet, K.J., Venkatesh, T.A.andSuresh., S., Acta Mater. 49 3899 (2001).CrossRefGoogle Scholar
4.Doerner, M.F. andNix., W.D.J. Mater. Res. 1 601 (1986).CrossRefGoogle Scholar
5.Venkatesh, T.A., Van Vliet, K.J.Giannakopoulos, A.E. and Suresh., S.Scr. Mater. 42 833 (2000).CrossRefGoogle Scholar
6.Alcala, J., Giannakopoulos, A.E., Suresh, S.J. Mater. Res. 13 1390 (1998).CrossRefGoogle Scholar
7.McElhaney, K.W., Vlassak, J.J. and Nix, W.D., J. Mater. Res. 13 1300 (1998).CrossRefGoogle Scholar
8.Pharr, G.M. and Bolshakov., A.J. Mater. Res. 17, 2660 (2002).CrossRefGoogle Scholar
9.Bolshakov, A. and Pharr, G.M., J. Mater. Res. 13 1049 (1998).CrossRefGoogle Scholar
10.Vlassak, J.J. and Nix, W.D., J. Mech. Phys. Solids 42 1223 (1994).CrossRefGoogle Scholar
11.Tansky, M. Elmer’s Products, Inc. (private communication).Google Scholar